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Method and device for measuring super conducting film surface resistance

A surface resistance and superconducting thin film technology, applied in the field of electronics, can solve problems such as measurement errors

Inactive Publication Date: 2005-02-16
NANKAI UNIV
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AI Technical Summary

Problems solved by technology

Measurement errors are often caused by errors in the surface resistance of the calibration piece or changes in the surface resistance of the calibration piece

Method used

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  • Method and device for measuring super conducting film surface resistance
  • Method and device for measuring super conducting film surface resistance
  • Method and device for measuring super conducting film surface resistance

Examples

Experimental program
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Effect test

example 1

[0083] Example 1: The metal cavity 1 is made of high-purity oxygen-free copper, with an inner diameter of 19.0mm. Dielectric cylinder A and dielectric cylinder B adopt sapphire dielectric, the cylinder diameters are 6.8mm and 6.0mm respectively, and the length is 4.0mm. The microwave coupling line is coupled with a semi-rigid coaxial cable coupling ring. Support ring 5 uses pure polytetrafluoroethylene. The test metal sample is a polished high-purity oxygen-free copper plate with a diameter of 50.8mm. During the test, the test device was directly placed in liquid nitrogen at a temperature of 77K.

[0084] According to the field distribution in the resonator, G can be calculated A = 292.56 and G B = 352.44. Q is measured using medium cylinder A and medium cylinder B respectively 0A =13233.6, Q 0B =14850.0, resonant frequency f A = 15.429GHz and f B =16.431GHz. From this we can calculate Q r =54959.96.

[0085] Surface resistance of high-purity oxygen-free copper plat...

example 2

[0086] Example 2: The test sample adopts Tl 2 Ba 2 CaCu 2 o X Superconducting thin film, 50.8mm in diameter. During the test, the test device was placed directly into liquid nitrogen.

[0087] Test results: at liquid nitrogen temperature (77K), Tl 2 Ba 2 CaCu 2 o X The surface resistance R of the superconducting thin film s (14.761GHz) = 0.688mΩ, R s (15.428GHz) = 0.761mΩ.

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Abstract

The present invention relates to a method for measuring surface resistance and its device, which is used for detecting metal material and superconducting material, in particular, it is a method and measuring device for detecting surface resistance of high-temperature superconducting film material. It adopts a medium-loaded resonator whose one end is short-circuited and another end is in opened state. It can respectively measure two microwave media loaded resonant cavities in which the decribed microwave media are respectively formed from two medium columns which are identical in material and length and different in diameter, so that it can define the system quality factor value Qr correspondent to other loss except tested sample, and further can meausre tested sample so as to obtain the surface resistance R of tested sample.

Description

technical field [0001] The invention relates to a method and a device for measuring surface resistance, which are used for detecting the surface resistance of metal materials and superconducting thin film materials, especially high temperature superconducting thin film materials, and belong to the field of electronic technology. Background technique [0002] The surface resistance of superconducting thin film materials is one of the important indicators to measure the microwave electrical properties of materials. For superconducting thin film materials, it is mainly to measure the surface resistance of the material at the superconducting temperature without damaging the sample during the measurement. [0003] Various methods have been used to measure the microwave surface resistance of superconducting thin films. The resonator method is a widely used method for measuring microwave surface resistance. The resonator method is further divided into two types: the sample-damage...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02
Inventor 阎少林张旭冯洪辉
Owner NANKAI UNIV
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