CPU card chip measuring method

A test method and chip technology, which can be used in electronic circuit testing, single semiconductor device testing, program control using stored programs, etc., and can solve problems such as inconvenience in testing

Inactive Publication Date: 2005-02-16
上海华园微电子技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Since the signal response of the CPU card chip is transmitted in the form of character frames, and the response of the chip is asynchronous; that...

Method used

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  • CPU card chip measuring method
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  • CPU card chip measuring method

Examples

Experimental program
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Embodiment Construction

[0018] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0019] Define the one-to-one correspondence between the pins of the chip to be tested (PAD) and the test channel of the tester during the preparation of the test program;

[0020] Through a matching subroutine (MatchMode) written in the test program, it is used to detect that the character frame on the output port is the start bit low level (START BIT), or it cannot wait until the start bit is low level;

[0021] Through the GPIB serial port protocol between the tester and the automatic probe station, the test file is dynamically modified during the test to generate a unique serial number.

[0022] Said first step is achieved by the following steps:

[0023] By defining whether each pin is an input port, an output port or a bidirectional port I / O;

[0024] By defining the generation mode of the electrical signal on each pin is the zero-return ...

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Abstract

The present invention relates to a testing method of CPU and chip, and said method includes the following steps: utilizing programing process of testing program defining the one-to-one correspondent relationship between the pin of chip to be tested and testing channel of test instrument; utilizing a matchmode writen in said testing program to detect that the character frame on detection output port is in start bit with low level or the start bit with low level can not be waited; utilizing GPIB serial protocol between test instrument and automatic probe platform, in the testing process dynamically modifying the testing file. Said invention can accurately sample every bit, and can obtain the accurate testing result.

Description

technical field [0001] The invention relates to a test method for an integrated circuit, in particular to a test method for a CPU card chip. Background technique [0002] A smart card is a new type of storage tool with a microprocessor and data information processing capabilities. The core of a smart card is an integrated circuit chip with a central processing unit, and a random access memory RAM, a read-only memory ROM, and an erasable read-only memory. Memory composed of EEPROM and dozens of bytes of PROM. Through the monitoring program composed of the operating system COS (Chip Operation System) in the chip, all the data are organically combined to form a file system, which can complete various specific functions. [0003] Smart cards with integrated circuits are rapidly popularized and developed in various fields of the national economy. A smart card with a CPU is the most important type of smart card. It is widely used in various fields such as finance, communication...

Claims

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Application Information

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IPC IPC(8): G01R31/28G06F9/06G06F9/40
Inventor 陈桂岭王上印义言
Owner 上海华园微电子技术有限公司
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