Fault selecting method and apparatus

A technology for selecting devices and faults, which is applied in the field of fault selection methods and devices, can solve problems such as failure to comprehensively consider fault occurrence rate and fault impact, lack of universality of test results, and reduced reliability of test results, etc., to achieve the result of fault selection The effects of standardization, avoidance of manufacturing failure forms, and reasonable selection of failures

Inactive Publication Date: 2006-05-10
HUAWEI TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] From the above, the premise of the fault selection method described in the prior art is to assume that the faults are evenly distributed. However, since the probability of fault occurrence is closely related to the process, operating speed and service conditions of the components themselves, for example, the fault rate of the transistor oscillator The failure rate is much higher than that of resistors. Therefore, if an equal number of resistors and transistors are injected into the system under test according to the method described in the prior art, the reliability of the test results will inevitably be reduced;

Method used

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  • Fault selecting method and apparatus

Examples

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no. 1 example

[0058] The first embodiment: in the failure analysis, the process of carrying out the parts list of the product under test and the parts list of the parts is as described above, and will not be repeated here. The damage degree of the tested product can usually be divided into four levels: fatal, serious, general, and warning. The specific meanings of the four levels are as follows:

[0059] Fatal - cause the whole machine to be paralyzed.

[0060] Severe—Loss of major functionality or severely degraded performance that will take longer to recover.

[0061] Fair—loss of minor function or slight decline in performance, with quick recovery.

[0062] Reminder—basically does not affect the function and performance, and it can be maintained afterwards.

[0063] The fault level division standard is clear, which can ensure that the analysis results of different testers on the impact of faults are basically consistent, so as to guide fault selection and ensure the consistency of test...

no. 2 example

[0074] The second embodiment: the process of performing component listing of the product under test and performing component listing of the components in the failure analysis is as described above, and will not be repeated here. The division of the failure impact level in the failure analysis process can also be based on the failure For the quantification of the economic loss caused by the tested product, the economic loss caused by the loss of system function and performance degradation caused by the internal failure of the switch is taken as an example to illustrate the quantification method.

[0075] Some failures of switch components (such as: signal transmission quality degradation, clock jitter) will lead to a decrease in call quality, occasional noise during user calls, and user complaints will lead to telecom operators starting maintenance projects. Assuming that the general maintenance cost is 1,000 yuan, the impact of this type of failure can be quantified as 1,000 yu...

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Abstract

The invention discloses a method for accident selection for performing accident injection test on products which comprises: getting accident modes and accident probability of each component; verifying accident influence grade according to the accident mode and preset accident influence grades of each component; performing accident selection according to the accident influence grade and the accident probability. The invention also discloses a device for performing accident selection. The invention has the advantages of improving accident injection test accuracy.

Description

technical field [0001] The invention relates to electronic or communication product testing technology, in particular to a fault selection method and device before fault injection testing is performed on the product. Background technique [0002] Fault Injection Test (Fault Injection Test) is a test that injects actual possible faults into the software and hardware or simulation model of the system under test, observes the system's handling of faults and other aspects of the response, and evaluates the reliability of the system. The fault test was first used to estimate the number of software defects, and later widely used in the reliability test of fault-tolerant computers and distributed systems. At present, in electronic equipment and control systems that require high reliability, most of the reliability indicators of the system are evaluated through fault injection testing: through fault injection testing, the performance and recovery of the product under specific faults...

Claims

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Application Information

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IPC IPC(8): G06F11/26
Inventor 姚益民
Owner HUAWEI TECH CO LTD
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