ExB ion detector for high efficiency time-of-flight mass spectrometers
An ion detector and detector technology, applied in time-of-flight spectrometers, spectrometer detectors, mass spectrometers, etc., can solve problems such as providing limited efficiency and reducing detection efficiency.
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[0034] The detector used for TOFMS is shown in figure 1 , which comprises a planar conductive entry plate 3 comprising a first window with a first highly penetrable metal grid 4 . This permeable grid is aligned with the trajectory of the incident ions 1, wherein the entrance plate 3 is oriented such that it is perpendicular to the axis of the ion beam. Usually the mesh penetration can reach 90%. This grid 4 is at the same potential V1 as the travel tube (not shown) of the ions. The ion detector also includes a planar conductive conversion plate 6 , wherein the conversion plate 6 includes a conversion component 5 aligned with the highly permeable metal grid 4 . The planar conversion element 5 comprises a material with a high probability of electron radiation per impinging ion, eg CVD diamond or oxide or other materials known for their high secondary radiation coefficient. The metal grid 4 and the conversion part 5 face the area of incident ions. The detection plate 6 and ...
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