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Memory

A memory and memory cell technology, applied in the field of memory, can solve problems such as increased interference and disappearance of data

Active Publication Date: 2007-04-04
OL SECURITY LIABILITY CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, in the aforementioned Japanese Unexamined Patent Application Publication No. 2003-7051, there is a problem in that accesses to memory cell blocks are prioritized in the order in which the number of accesses to the plurality of memory cell blocks reaches the predetermined number of times required for the update operation. update action
Therefore, even while the refresh operation is performed on the first memory cell block whose access count has reached the predetermined number of times required for the refresh operation, for example, the fourth memory cell block whose access count has reached the predetermined count required for the refresh operation is intensively refreshed. In the case of action, in JP-A-2003-7051, since it is the fourth memory cell block whose access times reach the specified number of times required for the update action, the update action will be performed, so this will occur. The fourth problem is that the access operation of the memory cell block whose access frequency has reached the specified number of times required for the update operation far exceeds the specified number of times required for the update operation
As a result, since the disturbance accumulated in the memory cells included in the fourth memory cell block whose number of accesses has reached the specified number of times required for the refresh operation increases, the problem of data disappearance due to disturbances arises.

Method used

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no. 1 approach

[0044] First, the configuration of the ferroelectric memory according to the first embodiment will be described with reference to FIGS. 1 to 7 .

[0045] As shown in FIG. 1, the ferroelectric memory of the first embodiment includes: a memory cell array 1, a row decoder 2, a comparison circuit 3, an update control circuit 4 with a storage unit 4a, an access detection unit 5 and a state machine circuit. 6 clock generating circuit 7, row address buffer 8, column address buffer 9, write amplifier 10, sense amplifier 11, input buffer 12, output buffer 13, column decoder 14, word line source driver 15, voltage A generation circuit 16 , a sense amplifier (sense amplifier) ​​17 , and a bit line source driver 18 . In addition, the update control circuit 4 is an example of the "update unit" of the present invention.

[0046] In the memory cell array 1, a plurality of word lines WL and a plurality of bit lines BL are arranged to intersect, and a ferroelectric capacitor 19 is arranged at...

no. 2 approach

[0095] Referring to FIGS. 10 to 12 , this second embodiment differs from the first embodiment in that it detects the order in which the number of accesses to each of the four memory cell blocks 1 a to 1 d is greater.

[0096] In this second embodiment, as shown in FIG. 10, in the structure of the first embodiment shown in FIG. Each of 1d is in the order of the most number of visits. In addition, the structure other than the comparison circuit 50 of 2nd Embodiment is the same as that of 1st Embodiment mentioned above.

[0097] As shown in FIG. 11, the comparator circuit 50 of the second embodiment is configured to output an output signal MXA as sequence data when the count signals CNTA to CNTD output from the respective counting circuit sections 22a to 22d (see FIG. 10) are input. ~MXD. The output signals MXA to MXD are 2-bit signals, and the output signals MXA to MXD respectively correspond to the memory cell blocks 1a to 1d (see FIG. 10 ). For example, when the number of t...

no. 3 approach

[0131] Referring to FIG. 14 , in this third embodiment, different from the first and second embodiments described above, an example of detecting the number of accesses to all memory cells in the memory cell array 1 will be described.

[0132] In this third embodiment, as shown in FIG. 14, in the configuration of the first embodiment shown in FIG. Counter 61 of times. In addition, the counter 61 is an example of the "second count detection part" of this invention. The counter 61 is configured such that the number of counts is increased by +1 each time an access operation to all the memory cells is detected by the access detection unit 5 .

[0133] Furthermore, in the third embodiment, when the counter 61 detects that the number of accesses to all memory cells in the memory cell array 1 has reached a predetermined number, the update control circuit 4 controls the update operation based on the comparison data output from the comparison circuit 3 .

[0134] In addition, other co...

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Abstract

This memory comprises: a first frequency detecting portion detecting access frequencies with respect to a plurality of memory cell blocks respectively, a comparator comparing the access frequencies with respect to the plurality of memory cell blocks detected by the first frequency detecting portion with each other, and a refresh portion exercising control for selecting a prescribed memory cell block from among the plurality of memory cell blocks on the basis of comparison data output from the comparator and preferentially rewriting data in the memory cells included in the selected memory cell block.

Description

technical field [0001] The present invention relates to a memory, and more particularly to a memory including an update unit for rewriting memory cells. Background technique [0002] Conventionally, it is known that in a ferroelectric memory, when a rewrite operation and a write operation are performed after a read operation of a memory cell including a ferroelectric capacitor, since a word line connected to a word line other than the selected word line When a predetermined voltage is applied to the memory cell, the polarization amount of the ferroelectric capacitor decreases, resulting in a disturbance phenomenon in which data is lost. In order to suppress such disturbances, conventionally known ferroelectric memories include a refresh unit that controls so as to rewrite (refresh) memory cells including ferroelectric capacitors. In such a conventional ferroelectric memory, when the number of accesses to all the memory cells reaches a predetermined number of times, by using...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/22
CPCG11C11/22G11C7/20
Inventor 宫本英明松下重治
Owner OL SECURITY LIABILITY CO
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