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Semiconductor element, semiconductor device, and method for manufacturing semiconductor element

a semiconductor and semiconductor technology, applied in the field of semiconductor elements, can solve the problem of large size of the entire semiconductor device, and achieve the effect of easy manufacturing

Inactive Publication Date: 2005-05-19
SHARP KK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides a semiconductor element that can be easily manufactured into a smaller semiconductor device compared to conventional semiconductor devices equipped with a shielding cap. The semiconductor element has electrode pads and a shielding layer for shielding electromagnetic waves on its side and back faces. This eliminates the need for manufacturing various shielding caps in different shapes and sizes, reducing complexity in manufacturing and management. The semiconductor device also has an external connecting terminal formed on the semiconductor element, making it a smaller semiconductor device than conventional semiconductor devices equipped with a shielding cap. The method for manufacturing the semiconductor element involves fixing a sheet or plate material on a wafer, forming a groove on the back face of the wafer, and forming a shielding layer on the back face of the wafer having the groove and on the concave portion of the groove. The method simplifies the manufacturing process and reduces complexity in managing various shielding caps.

Problems solved by technology

Namely, the conventional semiconductor device has a problem such that the entire size of the semiconductor device becomes very large, because the semiconductor device is covered with a shielding cap.

Method used

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  • Semiconductor element, semiconductor device, and method for manufacturing semiconductor element
  • Semiconductor element, semiconductor device, and method for manufacturing semiconductor element
  • Semiconductor element, semiconductor device, and method for manufacturing semiconductor element

Examples

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first embodiment

[0046] The following will explain an embodiment of the present invention with reference to FIGS. 1 through 9(a) to 9(c).

[0047] As shown in FIG. 1, a semiconductor chip (semiconductor element) 1 of the present embodiment is a semiconductor chip of a shielding type. The semiconductor chip 1 is provided with an element circuit (not shown) on a front face side. Further, a chip front face (element front face) 1a of the semiconductor chip 1 is provided with a passivation film 3 having an opening 3a only on a portion of an electrode pad 2. The passivation film 3 is composed of an inorganic material such as SiO2 and SiN, or an organic material such as polyimide. Two or more passivation films 3 may be provided. Note that, the manufacturing process of a semiconductor device generally consists of a wafer process called as a front-end process and an assembling process (packaging) called as a back-end process. The passivation film 3 is generally formed in a last step of the wafer process, becau...

second embodiment

[0084] The following will explain another embodiment of the present invention with reference to FIGS. 10 through 13(a) and 13(b). For ease of explanation, members having the same functions as those shown in the drawings pertaining to the first embodiment above will be given the same reference symbols, and explanation thereof will be omitted here.

[0085] A semiconductor chip (semiconductor element) of the present embodiment is also a semiconductor chip of a shielding type. In this semiconductor chip 50, the passivation film 3 is provided on a chip front face 50a that has an element circuit (not shown). The passivation film 3 has the opening 3a only at a portion on the electrode pad 2.

[0086] In the present embodiment, the electrode pad 2 is electrically connected to one end of secondary wiring 51, and an insulating layer 52 is formed thereon so as to have an opening 52a to reveal an electrode pad 51a formed with the secondary wiring 51. A taper is formed on a chip side face 50c of th...

third embodiment

[0108] The following will explain a further embodiment of the present invention with reference to FIGS. 14, 15, and 16(a) to 16(d). For ease of explanation, members having the same functions as those shown in the drawings pertaining to the first and second embodiments above will be given the same reference symbols, and explanation thereof will be omitted here.

[0109] In the present embodiment, explained is a semiconductor chip of a shielding type in which a shielding layer is also formed on a front face side of a semiconductor chip (semiconductor element).

[0110] In this semiconductor chip 60, the passivation film 3 is provided on a chip front face 60a that has an element circuit (not shown). The passivation film 3 has the opening 3a only at a portion on the electrode pad 2.

[0111] In the present embodiment, as in Second Embodiment, the electrode pad 2 is electrically connected to one end of the secondary wiring 51, and an insulating layer 52 is formed thereon so as to have an openi...

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Abstract

A semiconductor chip of the present invention is so arranged that a front face on which an element circuit is formed has electrode pads and a side face and a back face are coated with a shielding layer for shielding electromagnetic waves. With this, it is possible to provide a semiconductor element capable of being easily manufactured into a smaller semiconductor device compared with a conventional semiconductor device equipped with a shielding cap; a semiconductor device; and a method for manufacturing a semiconductor element.

Description

FIELD OF THE INVENTION [0001] The present invention relates to a semiconductor element having a shielding structure, a semiconductor device, and a method for manufacturing a semiconductor element. BACKGROUND OF THE INVENTION [0002] In these years, in accordance with the miniaturization of electronic equipments, there is a growing demand for electronic parts such as a semiconductor device that can realize miniaturization and high-density packaging. In response to this demand for higher density, it is required to mount both analog and digital circuits together, or devices having high clock frequency together. In these cases, noise is known to generate among the closely located devices due to electromagnetic waves. [0003] In order to shield a semiconductor device or module that is susceptible to electromagnetic waves from a semiconductor device or module that considerably generates electromagnetic waves, a whole semiconductor device or module is generally covered with a metal cap calle...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01L23/00H01L23/31H01L23/552H01L29/06
CPCH01L23/3114H01L23/552H01L2924/10253H01L2224/45144H01L2924/01033H01L2924/01024H01L2924/01006H01L2924/01005H01L24/48H01L24/97H01L29/0657H01L2224/16H01L2224/48227H01L2224/97H01L2924/01004H01L2924/01013H01L2924/01029H01L2924/01047H01L2924/01074H01L2924/01078H01L2924/01079H01L2924/10158H01L2924/15311H01L2924/16152H01L2924/3025H01L2224/81H01L2924/00014H01L2924/00H01L24/05H01L24/45H01L2224/02377H01L2224/05124H01L2224/05147H01L2224/05155H01L2224/05166H01L2224/05171H01L2224/05568H01L2224/05573H01L2224/05624H01L2224/05644H01L2224/05655H01L2924/12042H01L2924/181H01L2924/00012H01L2224/45015H01L2924/207
Inventor ISHIO, TOSHIYANAKANISHI, HIROYUKIMORI, KATSUNOBUIWAZAKI, YOSHIHIDESUMINOE, SHINJI
Owner SHARP KK