Unlock instant, AI-driven research and patent intelligence for your innovation.

Thin film forming apparatus and thin film forming method

a technology of thin film and forming method, which is applied in the manufacture of printed circuits, coatings, basic electric elements, etc., can solve the problems of increasing the cost of wiring pattern forming, complicated production process, and complex process, and achieves the effect of simple and economical process

Inactive Publication Date: 2005-10-20
DAINIPPON SCREEN MTG CO LTD
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This approach significantly reduces the number of transfer processes required, simplifies the thin film forming process, and lowers production costs by eliminating the need for complex processing steps like CMP, while maintaining the quality of thin film patterns on substrates such as semiconductor wafers and display panels.

Problems solved by technology

This makes the process complicated, disadvantageously increasing the wiring pattern forming cost.
In a recent semiconductor integrated circuit having a complicated arrangement, however, a number of thin films are formed on the surface of the substrate as typically seen in the case where multi-layer wirings are formed on a semiconductor substrate.
In such a case, when there is used the prior art above-mentioned in which only one-type thin film is transferred, at one time, from the sheet to the semiconductor wafer, it is required to execute the transferring processing many times. This complicates the production process, thus disadvantageously increasing the semiconductor production cost.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Thin film forming apparatus and thin film forming method
  • Thin film forming apparatus and thin film forming method
  • Thin film forming apparatus and thin film forming method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044]FIG. 1A to FIG. 1C are schematic section views illustrating a wiring forming method according to an embodiment of the present invention. First, there is prepared a semiconductor wafer (hereinafter simply referred to as wafer) 20 provided on the surface thereof with a gelatinous insulating film 21. Further, there is prepared a transfer member 30 having a surface on which projection-recess patterns are formed. The projecting portions 31 of the transfer member 30 have surfaces serving as thin-film carrying faces 31a. Metallic wiring film patterns 32 are formed on the thin-film carrying faces 31a. The projecting portions 31 of the transfer member 30 are formed in patterns corresponding to the wiring patterns to be formed on the wafer 20. Accordingly, the metallic wiring film patterns 32 are also formed in the wiring patterns to be formed on the wafer 20.

[0045] As shown in FIG. 1A, the wafer 20 and the transfer member 30 are disposed with the insulating film 21 and the metallic wi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
areaaaaaaaaaaa
insulatingaaaaaaaaaa
metallicaaaaaaaaaa
Login to View More

Abstract

Apparatus for forming a thin film pattern on the surface of a substrate. This apparatus is provided with: a transfer member having a thin film carrying surface which carries a thin film pattern; and a thin film transfer mechanism for joining the transfer member to a substrate for transferring, to the substrate, the thin film pattern on the thin film carrying surface. The thin film pattern may be a wiring film pattern. A gelatinous film may previously be formed on the substrate, and the thin film pattern may be transferred as embedded in the gelatinous film.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] The present invention relates to thin film forming apparatus for and thin film forming method of forming a thin film pattern or a plurality of thin films on a surface of any of a variety of substrates such as a semiconductor wafer, a glass substrate for a liquid-crystal-display-panel, a glass substrate for a plasma-display-panel, a photo mask substrate, a print-circuit board and the like. [0003] 2. Description of Related Art [0004] A damascene method is known as an example of the method of forming a metallic wiring such as a copper wiring or the like on a surface of a semiconductor wafer (hereinafter simply referred to as wafer). FIGS. 11A to 11D show a wiring forming process according to the damascene method. [0005] Formed on the wafer 1 is an insulating film 2, on which there are pattern-formed resists 3 having openings 3a corresponding to a metallic wiring pattern to be formed (FIG. 11A). With the use of the resi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): H01L21/027H01L21/00H01L21/48H01L21/768H01L23/498H05K3/20H10K99/00
CPCH01L21/4867H01L21/67092H01L21/768H01L21/76877H01L23/49816H01L51/0013Y10T29/5313H01L2924/01078H01L2924/15311H05K3/20H01L2924/01055Y10T156/1705H01L2224/16H10K71/18H01L21/027
Inventor UEYAMA, TSUTOMUISEKI, IZURU
Owner DAINIPPON SCREEN MTG CO LTD