Scanning probe microscopy tips composed of nanoparticles and methods to form same

a technology of nanoparticles and microscopy tips, which is applied in the direction of mechanical measurement arrangements, mechanical roughness/irregularity measurements, instruments, etc., can solve the problems of reducing resolution, limiting resolution, and limiting the spatial resolution of mfm sensors fabricated in this manner, so as to improve the spatial resolution of a magnetic force microscope (mfm) tip and strengthen the adhesion of nanoparticles
US20070256480A1Inactive Publication Date: 2007-11-08BLACK CHARLES T +3
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Applications(United States)
Current Assignee / Owner
BLACK CHARLES T
Publication Date
2007-11-08
Estimated Expiration
Not applicable · inactive patent

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Abstract

A structure and method for improving the spatial resolution of a scanning probe microscope (SPM) tip, which has been coated with a layer of chemically-synthesized nanoparticles. The nanoparticles are either single-species or heterogeneous, such that the single-species nanoparticles can be either ferromagnetic, paramagnetic, superparamagnetic, antiferromagnetic, ferrimagnetic, magneto-optic, ferroelectric, piezoelectric, superconducting, semiconducting, magnetically-doped semiconducting, insulating, fluorescent, or chemically catalytic. The layer of nanoparticles is at least two nanoparticles thick, or alternatively, is a single layer of nanoparticles thick, or alternatively, is a single layer of nanoparticles thick and covers only the tip apex portion of the tip, or alternatively, only a single nanoparticle is affixed to the tip apex. Alternatively, the layer of nanoparticles is transformed into an electrically-continuous magnetic film by annealing at a high temperature.
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Description

CROSS-REFERENCE TO RELATED APPLICATIONS

[0001] This application is a continuation of U.S. application Ser. No. 10 / 039,635 filed Jan. 2, 2002, the complete disclosure of which, in its entirety, is herein incorporated by reference.BACKGROUND OF THE INVENTION

[0002] 1. Field of the Invention

[0003] The present invention generally relates to scanning probe microscopy (SPM) and more particularly to a scanning probe microscope tip with improved spatial resolution using chemically-synthesized nanoparticles.

[0004] 2. Description of the Related Art

[0005] In scanning probe microscopy, specimens are imaged by scanning a sharp probe tip in close proximity to the specimen surface. Data acquired from the probe tip is plotted as a function of the location of the probe tip in the plane of the specimen surface.

[0006] Magnetic force microscopy is one of numerous scanning probe microscopy (SPM) techniques. Magnetic force microscopy is a probe to image magnetic fields in magnetic thin films. In the ...

Claims

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