Semiconductor structure having finfet ultra thin body and methods of fabrication thereof
a technology of semiconductors and thin bodies, applied in the direction of semiconductor devices, electrical equipment, transistors, etc., can solve the problems of complex system structure, system footprint and cost, and the inability to control the fet performance, and achieve the effect of reducing the complexity of the system
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[0025]In one aspect there is set forth herein a semiconductor structure having fins extending upwardly from an ultrathin body (UTB). In one embodiment a multilayer structure can be disposed on a wafer and can be used to pattern voids extending from a UTB layer of the wafer. Selected material can be formed in the voids to define fins extending upward from the UTB layer. In one embodiment silicon (Si) can be grown within in the voids to define the fins. In one embodiment, germanium based material can be grown within the voids to define the fins.
[0026]Fabrication of an exemplary semiconductor structure 10 is described with reference to FIGS. 1-17. Referring to FIG. 1 there can be provided a wafer 102 having one or more thin layer. Wafer 102 can include a layer 106 of bulk silicon, a layer 110 provided by an insulator and a layer 114. Layer 114 in one embodiment can include a thickness of from about 2 nm to about 20 nm. In one embodiment, layer 114 can be a silicon (Si) layer and wafer ...
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