Unlock instant, AI-driven research and patent intelligence for your innovation.

Electronic system for measurement of radiation-sensitive MOS devices

a radiation-sensitive mos device and electronic system technology, applied in the field of high-sensitivity semiconductor-based radiation dose detectors, can solve the problems of limiting the possibility of preventative measures or treatment, unsatisfactory, and worker may not know for a substantial amount of time, and achieve the effect of increasing the sensitivity of the radiation-induced capacitance respons

Inactive Publication Date: 2016-06-30
PURDUE RES FOUND INC
View PDF0 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides an apparatus for high-resolution real-time electronic measurement of radiation-induced capacitance response. The apparatus includes one or more radiation-sensitive metal oxide semiconductor capacitors (MOSCAPs) coupled with an external biasing source and a capacitive readout circuit. The apparatus alternates between a first switching state and a second switching state to allow for the coupling of the MOSCAPs with different polarities to the readout circuit. This allows for precise measurement of the radiation-induced capacitance response. The apparatus may also include a microprocessor / wireless transceiver integrated-circuit for processing and transmitting the readout circuit output to a base station for further signal processing and reporting. Overall, the invention provides a reliable and efficient tool for measuring radiation-induced capacitance response with high precision and in real-time.

Problems solved by technology

While this practice is very common, it is not ideal for several reasons.
The worker may also not know for a substantial amount of time after the dose was received, limiting the possibility of preventative measures or treatment.
Finally, there is no way to tell if the badge was even worn by the assigned user.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electronic system for measurement of radiation-sensitive MOS devices
  • Electronic system for measurement of radiation-sensitive MOS devices
  • Electronic system for measurement of radiation-sensitive MOS devices

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

Definitions

[0041]Where the definition of terms departs from the commonly used meaning of the term, applicant intends to utilize the definitions provided below, unless specifically indicated.

[0042]For purposes of the present invention, it should be noted that the singular forms, “a,”“an” and “the,” include reference to the plural unless the context as herein presented clearly indicates otherwise.

[0043]For purposes of the present invention, directional terms such as “top,”“bottom,”“upper,”“lower,”“above,”“below,”“left,”“right,”“horizontal,”“vertical,”“up,”“down,” etc., are used merely for convenience in describing the various embodiments of the present invention. The embodiments of the present invention may be oriented in various ways. For example, the diagrams, apparatuses, etc., shown in the drawing figures may be flipped over, rotated by 90° in any direction, reversed, etc.

[0044]For purposes of the present invention, a value or property is “based” on a particular value, property, t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A low-power wireless ionizing radiation measurement system is present that is intended to be used in a wearable dosimeter for occupational radiation monitoring. An apparatus is provided comprising a switching interface, wherein the switching interface alternates between a first switching state and a second switching state. In the first switching state, a radiation-sensitive metal oxide semiconductor capacitor (MOSCAP) is coupled to an external biasing source. In the second switching state, the radiation-sensitive MOSCAP is coupled with reversed polarity relative to the first switching state to a capacitive readout circuit to thereby allow for high-resolution real-time electronic measurement of a radiation-induced capacitance response.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application claims benefit of priority to U.S. Provisional Patent Application No. 62 / 065,087 to Valentino, et al., entitled, “MOS CAPACITOR-BASED, ACCUMULATING, RADIATION-SENSITIVE DETECTOR FOR OCCUPATIONAL, ENVIRONMENTAL AND MEDICAL DOSIMETRY,” filed Oct. 17, 2014 which is incorporated herein by reference in its entirety.BACKGROUND[0002]1. Field of the Invention[0003]The present invention relates to radiation dosimetry and, more specifically, to high-sensitivity semiconductor-based radiation dose detectors for occupational, environmental and medical dosimetry.[0004]2. Related Art[0005]Most countries require that employees who work with sources of ionizing radiation be monitored by a government-accredited program. Occupation dosimetry, as it is called, covers millions of radiation workers in healthcare, mining, the nuclear power industry, etc., and is designed to monitor the short and long-term exposure of such workers to potentially...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01T1/02
CPCG01T1/026G01T7/00G01T7/005H01L27/1443H01L31/119H01L31/1804
Inventor RAGHUNATHAN, NITHINSCOTT, SEAN M.PEROULIS, DIMITRIOSRAJABATHER, HARIKRISHNAWALEROW, P. ALEXANDERVALENTINO, DANIEL JOHN
Owner PURDUE RES FOUND INC