Dual-rail delay insensitive asynchronous logic processor with single-rail scan shift enable
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Benefits of technology
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0021]Asynchronous, or self-timed, processors implemented using delay insensitive asynchronous logic (DIAL) may include design for test (DFT) additional circuitry to ensure testability during production.
[0022]Description of Apparatus
[0023]FIG. 1A is a block diagram of a circuit 100, which may be a small portion of a synchronous processor. The synchronous processor may have multiple instances of circuit 100. The circuit 100 has a clocked flip-flop (FF) 130 that stores a Boolean value “Data” provided by combinatorial logic 110, such as data to be input to the FF 130 during use of the processor to perform data processing and / or mathematical calculations. The FF 130 has an input data D for receiving values of Data, an output data Q, and a clock input Clock.
[0024]The operation of the FF 130 is synchronized by a clock signal Clock. The value Data is accepted by, or loaded into, the input data D on an active edge (i.e. either the rising edge or the falling edge) of the clock signal Clock. ...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



