Method and arrangement for deeply resolved optical detection of a sample
a deep resolution, optical detection technology, applied in the field of fluorescence microscopy, can solve the problems of limited usable sequential recording of images, readout and calculation, etc., and achieve the effect of preventing the limitation of the dynamic range of the detector and preventing residual modulations of the confocal section imag
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[0037]The arrangement, according to the invention, for a line scanner is shown schematically in FIG. 2A (side view) and FIG. 2B (top view). The solid lines in the beam path represent the illumination beam path. The dashed lines represent the detection beam path. In a line scanner, the specimen is illuminated by a line focus, e.g., along the X coordinate which is shifted in the coordinate vertical to the line. For this purpose, the light source LQ (FIG. 2A), which can radiate one wavelength or a plurality of wavelengths as well as wavelength bands or which can be a white light source, is focused in a line-shaped manner in an intermediate image plane ZB of the microscope device by means of optics ZL, cylindrical lens, and optics RL, relay lens. A diffraction-limited, line-shaped intensity distribution results along the X coordinate on the specimen PR by focusing in Y-direction in the second intermediate image ZB / G, where G is an amplitude grating, after traversing the scanner SC, scan...
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