Gate drivers for stacked transistor amplifiers

a transistor amplifier and gate driver technology, applied in the field of amplifiers, can solve problems such as power consumption, and achieve the effect of reducing the overall leakage curren

Active Publication Date: 2017-12-12
PSEMI CORP
View PDF27 Cites 45 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0007]The various teachings according to the present disclosure describe biasing circuits for providing biasing voltages of the stacked transistors that have different characteristics between the active mode and the standby mode, while maintaining voltage compliance of the low voltage transistors of the stack for safe operation in both modes of operation and reducing overall leakage current in the standby mode.

Problems solved by technology

However, conflicting characteristics of a biasing circuit that provides biasing voltages to the staked transistors may exist between operation in the active mode and in the standby mode, such as, for example, an impedance presented to the gates of the transistors of the stack during the active mode of operation, and a power consumed in the biasing circuit and in the stacked transistors during the standby mode of operation.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Gate drivers for stacked transistor amplifiers
  • Gate drivers for stacked transistor amplifiers
  • Gate drivers for stacked transistor amplifiers

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028]Throughout the present disclosure, embodiments and variations are described for the purpose of illustrating uses and implementations of inventive concepts of various embodiments. The illustrative description should be understood as presenting examples of the inventive concept, rather than as limiting the scope of the concept as disclosed herein.

[0029]FIG. 1 shows a simplified schematic of a prior art stacked cascode (RF) amplifier (100). By way of example and not of limitation, the stacked cascode amplifier (100) can comprise a stack of FET transistors (M1, M2, M3, M4) that include an input transistor M1, cascode transistors (M4, M3, M2), and an output transistor M4. An input RF signal, RFin, provided at an input terminal (120) of the amplifier (100) is routed to a gate of the input transistor, M1, and is amplified by the amplifier (100). A corresponding amplified output RF signal, RFout, is provided at a drain of the output transistor, M4, and routed to an output terminal (13...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Various methods and circuital arrangements for biasing one or more gates of stacked transistors of an amplifier are possible where the amplifier is configured to operate in at least an active mode and a standby mode. Circuital arrangements can reduce bias circuit and stacked transistors standby current during operation in the standby mode and to reduce impedance presented to the gates of the stacked transistors during operation in the active mode while maintaining voltage compliance of the stacked transistors during both modes of operation.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]The present application is related to U.S. application Ser. No. 15 / 268,297 entitled “Standby Voltage Condition for Fast RF Amplifier Bias Recovery” filed on even date herewith, the disclosure of which is incorporated herein by reference in its entirety. The present application is also related to U.S. application Ser. No. 15 / 268,229 entitled “Cascode Amplifier Bias Circuits” filed on even date herewith, the disclosure of which is incorporated herein by reference in its entirety. The present application is also related to U.S. application Ser. No. 15 / 268,257 entitled “Body Tie Optimization for Stacked Transistor Amplifier” filed on even date herewith, the disclosure of which is incorporated herein by reference in its entirety.[0002]The present application may be related to U.S. Pat. No. 7,248,120, issued on Jul. 24, 2007, entitled “Stacked Transistor Method and Apparatus”, the disclosure of which is incorporated herein by reference in its e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(United States)
IPC IPC(8): H03F1/22H03F1/02H03F3/193
CPCH03F1/0211H03F3/193H03F2200/451H03F2200/21H03F2200/18H03F1/0261H03F1/223H03F2200/522
Inventor WAGH, POOJANPAL, KASHISHENGLEKIRK, ROBERT MARKRANTA, TERO TAPIOBARGROFF, KEITHWILLARD, SIMON EDWARD
Owner PSEMI CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products