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Random pattern measuring method for statistic modulation transfer function

A modulation transfer function and pattern technology, which is applied in the field of photoelectric imaging system product quality inspection and statistical modulation transfer function measurement, can solve problems such as complex implementation process, achieve high flexibility and operability, simple test process, and facilitate computer automation The effect of the test

Inactive Publication Date: 2008-09-17
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the implementation process of these methods is still relatively complicated, and it is necessary to make a photo film with random noise, or use a projector, etc.

Method used

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  • Random pattern measuring method for statistic modulation transfer function
  • Random pattern measuring method for statistic modulation transfer function
  • Random pattern measuring method for statistic modulation transfer function

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] First, using the linear congruential generator LCG pseudo-random number generator algorithm, according to the following formula

[0033] (n=1, 2, 3...N)

[0034] Here M=255, N=128 are taken, and the initial values ​​of a, c, and x0 that meet the conditions are randomly selected each time (x n , M, a, and c are all non-negative integers), generate several groups of pseudo-random numbers of a certain length, and generate grayscale random stripe patterns by computer;

[0035] (2) The digital image run length RLE8 compression encoding protocol is used to compress the grayscale random pattern data, and the compressed data is sent to the liquid crystal reticle graphic generator according to the communication protocol between the computer and the liquid crystal circuit, and the high-resolution liquid crystal graphic generator displayed on the Figure 4 As shown, the left picture is the random fringe pattern used as the test target, and the right picture is the image captur...

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PUM

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Abstract

The invention supplies a random pattern measure method of statistic modulate transfer function, Adoption of the power spectrum relatively gain the transfer function, use random stripe measure drone, or other random pattern drone, the random pattern would be made up by computer random arithmetic, it have no use for scan institution and precise level institution, it can get modulate transfer function characteristic quickly on the traditional meaning test of the discrete sampling imaging system under computer controlled. The invention could be used to easily gain mass random stripe test pattern or other style test pattern, t will be convenient for testing on the statistic meaning and have a high degree of flexibility and maneuverability; its same translation characteristic avoid Micron Precision Mechanical scanning; it used high-graphics LCD as optical pattern generator and applied to optical measurement its simple test process don't need high professional skills , it is beneficial to the realization of computer automated test.

Description

technical field [0001] The invention belongs to the technical field of imaging quality testing of photoelectric imaging systems, and relates to a method for measuring the statistical modulation transfer function of non-space translation invariant discrete imaging systems, which can be used for product quality inspection of photoelectric imaging systems. Background technique [0002] In recent years, with the rapid development of science and technology, traditional optics has gradually developed in the direction of digitalization and the combination of optoelectronics. A variety of new products and devices emerge in an endless stream, and CCD, CMOS, end faces of imaging fiber bundles, fiber optic panels, etc. have been widely used. The optical transfer function is generally considered to be a relatively perfect index for evaluating the imaging quality of an optical system. Its concept is based on the linearity and space invariance (also called isohalosis) of the system. For ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/00H04N5/335H04N25/00
Inventor 张旭升周桃庚陈凌峰何川沙定国林家明
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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