System and method for measuring phase
A phase, low coherence technique applied in the field of systems and methods for phase measurement
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0436] Example 1: Phase imaging of calibration samples
[0437] In this example, calibrated samples were studied and illustrated that the present invention can provide quantitative information at the nanometer (nm) scale. The samples consisted of metal deposits on a glass substrate, which were then etched. The metal deposit pattern is in the shape of a figure "8" and the thickness of the metal layer is about 140nm as measured by a microscopic light wave interferometer.
[0438] Figures 60A-60D Shown are images acquired with the system using reflection geometry at four different phase shifts δ. Figure 60A is the image 2000 with δ=0; Figure 60B is the image 2200 of δ=π; Figure 60C is the image 2400 of δ=π / 2; and Figure 60D is an image 2600 of δ=3π / 2.
[0439] Figure 61 Schematically illustrates the electric field vector E 2102 and the high frequency wave vector component E of the electric field H and the low frequency wave vector component E of this electric fiel...
Embodiment 2
[0443] Example 2: Phase Imaging of Phase Grating
[0444] Figure 64 A phase image 2400 of a phase grating with trenches nominally 10 microns wide and nominally 266 nm deep obtained using transmission geometry is shown. exist Figure 64 Among them, the unit of Z axis 2402 is nm, and the unit of Y axis 2404 and X axis 2406 is CCD pixel. Vertical scale 2408 is also in nm and is provided to further aid in determining depth (Z-axis dimension) from phase image 2400 .
Embodiment 3
[0445] Example 3: Phase image of onion cells
[0446] In this example, onion cells were phase imaged using transmission geometry in accordance with the present invention. Intensity images of onion cells 2500 are shown at Figure 65 in order to be in Figure 66 Phase image 2550 shown in . exist Figure 65 and Figure 66 , the y-axis 2502, 2552 and the x-axis 2504, 2554 are in units of CCD pixels. Figure 66 The scale bar in 2556 is in nm.
[0447] Intensity image ( Figure 65 ) represents the first frame taken without a phase shift δ=0 between the low frequency component and the high frequency component. as compared Figure 65 and Figure 66 As shown, the conventional microscope (intensity) images have very low contrast relative to the phase images obtained according to the present invention. as in Figure 66 As seen in , the contrast in the phase image is greatly enhanced, and in this case much finer cellular structures can be distinguished. In addition, the info...
PUM
Property | Measurement | Unit |
---|---|---|
length | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com