Method for measuring thickness of sample on diamond anvil cell

A diamond anvil and sample thickness technology, which is applied in the field of physical quantity testing, can solve the problems of inability to obtain sample thickness, and achieve simple and effective design and processing, and the effect of solving thickness measurement problems

Inactive Publication Date: 2007-09-19
JILIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved in the present invention is to design a new method for measuring the thickness of the sample on the diamond anvil, so as to overcome the disadvantage that the background technology cannot obtain the thickness of the sample under any pressure, and to maximize the influence of the deformation of the diamond on the thickness of the sample. influence, more accurately obtain the value of the thickness of the diamond on the anvil under each pressure

Method used

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  • Method for measuring thickness of sample on diamond anvil cell
  • Method for measuring thickness of sample on diamond anvil cell
  • Method for measuring thickness of sample on diamond anvil cell

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0039] In conjunction with accompanying drawing, further illustrate the diamond of the present invention to the measuring method of sample thickness on the anvil

[0040] In Figure 1, 1 is the diamond on the anvil, which is divided into upper and lower two, 2 is the sample chamber, 3 is the gasket, generally made of T-301 stainless steel, and 4 is the measuring probe, which can be hard alloy The material probe is installed on the bayonet of the micrometer. When measuring, the measuring probe directly touches the upper and lower bottom surfaces of the diamond counter-anvil.

[0041] In the experiment, a diamond counter-anvil with an anvil surface of 300 microns was used. The diamond 1 has a lead angle of 8.5 degrees. The total height H of the two diamonds 1 0 It is 4.009mm. Thickness measurements were performed on alumina samples.

[0042] The first step is to measure the height of the two diamonds on the diamond anvil under normal pressure and record it as H 0 =4.009mm; put...

Embodiment 2

[0051] In the experiment, the diamond counter-anvil of Example 1 was used to measure the thickness of the sample under any pressure for the same sample of Example 1.

[0052] The first step, with the first step of embodiment 1.

[0053] The second step is to measure a set of arbitrary pressure P and the reading T of the micrometer during the pressurization process L (P) One-to-one corresponding data, see Table 1; when the pressure reaches the maximum value of 41.43GPa, record the reading of the micrometer at this time as T L (max) = 4.001 mm.

[0054] pressure P

(GPa)

0

0.27

6.25

9.80

15.00

18.50

23.50

34.26

37.98

39.31

micrometer reading

Count T L (mm)

4.09

4.085

4.062

4.047

4.037

4.030

4.020

4.008

4.005

4.003

[0055] Step 3: Start decompression when the pressur...

Embodiment 3

[0061] As mentioned earlier, the deformation of diamond is D P =H 0 -[T D (P)-t max ] (Formula 3), thus, the deformation D of diamond can be obtained P Along with the variation curve of pressure P, the deformation amount D of the diamond drawn by the measurement result of embodiment 2 P The change curve with pressure P is shown in Figure 3. In this way, knowing the measured thickness T at any pressure during the pressurization process L (P) and diamond row variable D P , using t(P)=T L (P)-(H 0 -D P ) (Formula 4), the sample thickness t(P) under any pressure can be obtained. The change curve of sample thickness t(P) with pressure P can be drawn. From the measurement results of Example 2, the curve of the sample thickness t(P) varying with the pressure P is shown in FIG. 4 .

[0062] In the experiment, the maximum pressure applied is 41.4GPa, under this pressure the displacement of the diamond is 16 microns, and the thickness of the sample at this time is only 8 micr...

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Abstract

The method of measuring the thickness of the sample on the top anvil by the adamas pertains to the field of physical quantity testing technology. The testing steps are: the height of the two pieces of adamas measuring the top anvil in the normal atmosphere pressure is HO; the intensity of pressure P and the thickness TL (P) of the adamas and the sample is measured to obtain the corresponding data in the pressurizing process; when the biggest value is achieved, the pressure is going to be relieved and the intensity of pressure P and the thickness TD(P) of the adamas and the sample is measured to obtain the corresponding data in the pressure relieving process; the thickness of the adamas and the sample is TD(0) when the measured pressure is reduced to the normal atmosphere pressure; the curve TL(P) ~P and TD(P)~P are fitted in a same frame of axes; the thickness t(P) of the sample in a random pressure P is calculated by the formula of t(P)=TD(0)-H0+TL(P)-TD(P). The factors that influence the measuring of the thickness of the sample on the top anvil by the adamas are eliminated by simple and effective design and the problem of measuring the thickness that puzzles the research man of the high pressure is solved.

Description

technical field [0001] The invention belongs to the technical field of physical quantity testing, and in particular relates to a method for measuring the thickness of a diamond on an anvil. Background technique [0002] The application of diamond-on-anvil (DAC) is a major breakthrough in the field of high-voltage testing and is currently the most common high-voltage generating device used by high-voltage researchers. Its ability to generate ultra-high pressure conditions provides people with the possibility of a deeper understanding of the high-pressure nature of matter. With the emergence of various high-energy detection equipment, people have achieved a variety of physical research with the help of DAC technology, such as material structure research, Raman spectroscopy research, fluorescence spectroscopy research, magnetic conversion research, electrical properties research, etc. In the study of the electrical properties of the material on the diamond anvil, the thickness...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B5/06
Inventor 李明高春晓贺春元郝爱民黄晓伟张东梅于翠玲
Owner JILIN UNIV
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