Unlock instant, AI-driven research and patent intelligence for your innovation.

Ditching type capacitor and its producing method

A manufacturing method and capacitor technology, which is applied in semiconductor/solid-state device manufacturing, electric solid-state devices, circuits, etc., can solve problems such as complicated processes, and achieve the effect of avoiding damage

Active Publication Date: 2007-10-10
UNITED MICROELECTRONICS CORP
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the processes of the above-mentioned two patent documents are relatively complicated, and still cannot effectively solve the above-mentioned problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ditching type capacitor and its producing method
  • Ditching type capacitor and its producing method
  • Ditching type capacitor and its producing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] 2A to 2H are cross-sectional views of the manufacturing process of the memory according to the embodiment of the present invention.

[0049] First, referring to FIG. 2A , a substrate 200 is provided, and a mask layer 201 is formed on the substrate 200. This mask layer 201 can be, for example, a pad oxide layer 202 and a layer of pad oxide layer 202 from the substrate 200 upwards. Silicon nitride layer 204 . The method for forming the pad oxide layer 202 is, for example, thermal oxidation, and the method for forming the silicon nitride layer 204 is, for example, chemical vapor deposition (CVD). Thereafter, the pad oxide layer 202 and the silicon nitride layer 204 are patterned, and the substrate 200 is etched to form a plurality of trenches 206 in the substrate 200 .

[0050] Then, referring to FIG. 2B , a lower electrode 208 is formed in the substrate 200 on the surface of the trench 206 . The method for forming the lower electrode 208 is, for example, to first form a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The method for fabricating canal type capacitor includes following steps: carrying out patternizing procedure by using patternized mask layer on substrate in order to form multiple canals in the substrate; forming low electrode in substrate of each canal surface; removing partial patternized mask layer to expose partial substrate on two sides of top portion of each canal; forming dielectric layer of capacitance on substrate and surface of each canal; being formed above the substrate, conductive layer fills in each canal, and covers dielectric layer of capacitance; removing patternized mask layer and partial conductive layer, and reserving partial conductive layer of covering the dielectric layer of capacitance in order to form up electrode.

Description

technical field [0001] The invention relates to a storage capacitor and a manufacturing method thereof, in particular to a trench capacitor and a manufacturing method thereof. Background technique [0002] With the continuous miniaturization of components, the size of the components is gradually reduced. For storage components with capacitors, the space for making capacitors is getting smaller and smaller. The trench capacitor storage element is an element that utilizes the space in the substrate to manufacture capacitors to gain area, so it is very in line with the current market demand. [0003] There is an existing manufacturing method of a trench capacitor, as shown in FIG. 1A , first forming a silicon oxide layer 102 and a silicon nitride layer 104 on a substrate 100 in sequence. Then, an etching process is performed to etch part of the silicon nitride layer 104 and the silicon oxide layer 102 to form several openings 106 exposing the surface of the substrate 100 . ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/00H01L21/02H01L21/82H01L21/8222H01L21/8242H01L27/00H01L27/02H01L27/06H01L27/102H01L27/108H01L29/92H10B12/00
Inventor 李瑞池
Owner UNITED MICROELECTRONICS CORP