Method of manufacturing semiconductor device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- FUJITSU MICROELECTRONICS LTD
- Publication Date
- 2007-10-31
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
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Abstract
Description
Technical field
[0001] The present invention relates to a method of manufacturing a semiconductor device, and more particularly, to a method of manufacturing a semiconductor device in which a light receiving element part, a CMOS element, and a bipolar transistor element are formed on one chip. Background technique
[0002] Generally, most light receiving elements are formed as a single element. Therefore, in order to process the received signal, the light receiving element part is used together with the signal processing element part. Alternatively, the light receiving element part and the signal processing semiconductor device are integrated in the same package. Thus, the light receiving element partly functions as a hybrid integrated circuit.
[0003] Against this background, a method of forming a light receiving element part and a signal processing element part on one chip has been proposed. According to the above method, miniaturization of the circuit can be achieved. Example...