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Phase diaphragm for 4f phase coherence imaging system

A technology of imaging system and phase diaphragm, which is applied in the field of optical components to achieve the effect of improving detection sensitivity

Inactive Publication Date: 2008-04-30
常熟苏大低碳应用技术研究院有限公司
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Problems solved by technology

[0004] Although the 4f phase coherent imaging method cleverly uses the phase diaphragm to realize the measurement of the magnitude and sign of the nonlinear refractive index, there is still a problem of detection sensitivity

Method used

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  • Phase diaphragm for 4f phase coherence imaging system
  • Phase diaphragm for 4f phase coherence imaging system
  • Phase diaphragm for 4f phase coherence imaging system

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Embodiment 1

[0034]Embodiment 1: Accompanying drawing 1 is the experimental device diagram of 4f phase-coherent imaging system. The experimental setup can be divided into two parts: measurement system and energy reference system. The measurement system consists of a laser 1 , a phase diaphragm 2 , a convex lens 3 , a sample to be measured 4 , a convex lens 5 , a neutral filter 6 and a CCD camera 7 . The convex lens 3 and the convex lens 5 constitute a 4f system, the phase diaphragm 2 is placed on the object plane of the 4f system, the sample 4 to be tested is on the Fourier plane, and the CCD camera 7 receives the pulse image on the image plane of the 4f system. The laser beam emitted from the laser first undergoes beam expansion, which is omitted in Figure 1. The expanded laser pulse passes through the phase diaphragm to form near top-hat light. On the sample to be tested on the leaf surface, the phase of the incident pulse changes due to the nonlinear refraction property of the sample t...

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Abstract

The invention relates to a phase aperture which is used for a 4f phase coherence imaging system. The aperture body is composed of an annular light penetrating strip which is at the periphery side and a phase object which is at the center part. The invention is characterized in that the phase object is divided into two parts. The phase difference between one part of the phase object and the annular light penetrating strip is 2mPi plus Pi / 2, and the phase difference between the other part of the phase object and the annular light penetrating strip is 2nPi-Pi / 2. In the formula, m and n are integers. The measuring precision of the system can be increased in the range of a nonlinear phase shift of |PsiNL| being less than Pi by an improved phase aperture. For a positive nonlinear phase shift, the improvement of the sensitivity can be reached 1.72 times at the most degree. But for a negative nonlinear phase shift, the improvement of the sensitivity is especially obvious. When the formula PsiNL being equal to minus Pi is valid, the improvement of the sensitivity can be enhanced by 7.26 times.

Description

technical field [0001] The invention relates to an optical element, in particular to a phase diaphragm capable of improving the measurement accuracy of a 4f phase coherent imaging system. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, research on nonlinear photonic materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear photonic materials. Optical nonlinear measurement technology is one of the key technologies to study nonlinear photonic materials. Among them, the 4f phase coherent imaging system (G.Boudebs and S.Cherukulappurath, "Nonlinear optical measurements using a 4f coherent imaging system with phase object", Phys.Rev.A, 69, 053813 (1996)) is a measurement proposed in recent years A new approac...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B5/00G01N21/41
Inventor 宋瑛林李云波顾济华王玉晓杨俊义吴茂成
Owner 常熟苏大低碳应用技术研究院有限公司
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