Self-aligning metal silicide preparation method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SEMICON MFG INT (SHANGHAI) CORP
- Publication Date
- 2008-07-02
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a method for manufacturing a self-aligned metal silicide. Background technique
[0002] Metal silicide is widely used in source-drain contacts and gate contacts to reduce contact resistance due to its low resistivity and good adhesion to other materials. The refractory metal and silicon react together to form a metal silicide, and a low-resistivity metal silicide can be formed through a one-step or multi-step annealing process. With the shrinking of the size of semiconductor devices, the requirements for device performance are getting higher and higher, especially for technology nodes of 90nm and below. In order to obtain lower contact resistance, the industry uses nickel, cobalt and other metals instead of titanium to form low resistivity. metal silicide metal material. Chinese patent application No. 03814954.0 discloses a method for manufacturing nickel me...