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Sound suspending polishing device for nanometer mechanics characterization sample

A technology of acoustic suspension and mechanics, applied in the preparation of test samples, etc., can solve problems such as poor applicability and poor polishing effect, and achieve the effects of good applicability, improved dispersion, and uneven scratch size.

Inactive Publication Date: 2010-09-15
ZHEJIANG UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to overcome the shortcomings of poor applicability and poor polishing effect of the existing sample preparation equipment for nanomechanical characterization, the present invention provides an acoustic levitation polishing equipment for nanomechanical characterization samples with good applicability and good polishing effect

Method used

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  • Sound suspending polishing device for nanometer mechanics characterization sample
  • Sound suspending polishing device for nanometer mechanics characterization sample

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Embodiment Construction

[0015] The present invention will be further described below in conjunction with the accompanying drawings.

[0016] refer to figure 1 , a kind of acoustic levitation polishing equipment for nanomechanical characterization samples, including a frame, a pulse power supply 4, a fixture 9 for clamping a workpiece to be processed, an ultrasonic transducer 7, a container 11 for storing polishing liquid, an ultrasonic reflection end and a tuning mechanism for adjusting the distance between the ultrasonic reflection end 13 and the ultrasonic transducer 7, the ultrasonic transducer 7, the container 11 and the tuning mechanism are all installed on the frame, the pulse power supply 4 and the The ultrasonic transducer 7 is connected, the container 11 is located below the ultrasonic transducer 7, the clamp 9 is located above the container 11, the clamp 9 is connected to the pulley transmission mechanism, and the ultrasonic reflection end 13 is located below the container 11, the ultrason...

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Abstract

The invention discloses an acoustic levitation polishing machine of mechanically representing nano test samples and comprises a machine frame, a pulse power source, a holding fixture that is used for clamping a working piece to be processed, an ultrasonic energy transducer, a container that is used for storing polishing liquid, an ultrasonic reflecting end, and a tuning mechanism that is used foradjusting the distance between the ultrasonic reflecting end and the ultrasonic energy transducer. The ultrasonic energy transducer, the container and the tuning mechanism are all arranged above the machine frame, the pulse power source is connected with the ultrasonic energy transducer, the container is arranged under the ultrasonic energy transducer, the holding fixture is arranged above the container and is connected with a belt wheel actuating mechanism, and the ultrasonic reflecting end is arranged under the container, coordinated with the ultrasonic energy transducer and connected with the tuning mechanism. The invention provides an acoustic levitation polishing machine of the mechanically representing nano test samples with good applicability and well polishing effect.

Description

technical field [0001] The invention relates to a grinding and polishing machine equipment, in particular to an acoustic levitation polishing equipment for nanomechanical characterization samples. Background technique [0002] Nanoindentation system technology is gradually becoming one of the most important testing methods in the field of nanomechanical characterization. It can accurately complete indentation experiments with a range of tens of nanometers, forming a nanoindentation measurement technology. However, the sample preparation method for nanomechanical characterization is a recognized technical problem in this field that needs to be solved urgently. The more processing methods used today are focused ion beam processing, elastic emission processing, fluid vibration polishing technology, etc. Although these methods have achieved certain results in the preparation of samples for nanomechanical characterization, there are still many problems. Such as focused ion beam ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/32
CPCB24B1/04
Inventor 文东辉陈锋张克华
Owner ZHEJIANG UNIV OF TECH
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