Method for manufacturing micromechanical components
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- VALTION TEKNILLINEN TUTKIMUSKESKUS
- Publication Date
- 2013-04-24
- Estimated Expiration
- Not applicable · inactive patent
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
technical field
[0001] The present application relates to a method for obtaining narrow gaps in micromechanical components, in particular in micromechanical SOI-wafer structures, according to the preamble of claim 1 .
[0002] The present invention also relates to the silicon micromechanical structure according to any one of claims 8-9, and the application of the silicon micromechanical structure according to any one of claims 20-21. Background technique
[0003] According to prior art methods, silicon-micromechanical devices, such as acceleration sensors and other similar devices, are mainly manufactured by using SOI (silicon-on-insulator) wafer structures, on which grooves are etched, and the walls of the grooves are oxidized , and then the surface of the groove was made flat by fluorine-plasma etching.
[0004] [W.-T.Hsu, J.R.Clark, and C.T.-C Nguyen, 'A sub-micron capacitivegap process for multiple-metal-electrode lateral micromechanical resonators by Hsu et al. Micron...