Wafer kit, monitoring system and method for semi-conductor production process
A production process and monitoring system technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of wafer particle contamination, wafer damage, production time delay, etc., to avoid fragmentation or debris, reduce Possibilities, strong practical effects
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[0027] In the embodiment of the present invention, a vibration sensor is installed on the box body of the wafer box to monitor the vibration intensity of the wafer box.
[0028] The wafer box provided by the present invention includes: a box body, a vibration sensor installed on the box body and outputting an alarm signal when the vibration intensity of the wafer box exceeds a predetermined vibration intensity.
[0029] The monitoring system of the semiconductor production process provided by the present invention includes: a vibration sensor installed on the box body of the wafer cassette, which outputs an alarm signal when the vibration intensity of the wafer cassette exceeds a predetermined vibration intensity; a receiving device for receiving the vibration The alarm signal output by the sensor and the vibration information of the wafer box are output; the recording device records the vibration information of the wafer box output by the receiving device.
[0030] figure 1 ...
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