Temperature parameterized reduced-order modeling method for micro-electromechanical system
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NORTHWESTERN POLYTECHNICAL UNIV
- Publication Date
- 2010-12-29
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a temperature parameterized order reduction modeling method of a micro-electro-mechanical system (MEMS), belonging to the field of micro-electro-mechanical system design and model reduction. Background technique
[0002] The MEMS device structure is usually made of silicon and processed by semiconductor technology. Since silicon is a heat-sensitive material, its physical properties are greatly affected by temperature. When the temperature changes, the Young's modulus, thermal diffusivity and thermal stress of silicon will change greatly, and the changes of these physical properties It will affect the resonant frequency of the MEMS device, resulting in a large error in the output signal.
[0003] In order to shorten the development cycle and reduce product costs, it is necessary to improve the efficiency of design and simulation. Generally, the original model can be processed, and a certain order reduction method can be used t...