Method for measuring material nonlinearity based on phase object single-pulse reflection

Abstract

The invention discloses a method for measuring material nonlinearity based on phase object single-pulse reflection. Incident laser is divided into two beams through a first beam splitter: one beam of light is detecting light recorded by a first detector; the other beam of light passes through the phase object and then is focused on sample to be measured by lens; the intense pulsed light reflected from the surface of the sample to be measured is divided into two beams by a second beam splitter: one beam of light is directly recorded by a second detector; while the other beam of light enters a third detector through a small-holed aperture slot of which the center is coincident with the optical axis. The invention discloses a new method for measuring the optical nonlinearity of medium surface, which realizes the measurement of coefficient of nonlinear refraction and absorption, and can be widely applied in the research field of media interface nonlinear optical measurement and thin-film nonlinear optical measurement.

Description

technical field [0001] The invention relates to a method for measuring the nonlinear properties of materials by using optical means, in particular to a method for measuring the optical nonlinearity of the medium interface reflection based on the single pulse reflection of the phase object and the method for measuring the optical nonlinearity of the thin film by using the reflected light. In the field of linear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, the research on nonlinear optical materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear optical materials. Optical nonlinear measurement technology is one of the key technologies for ...

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Problems solved by technology

However, the above-mentioned measurement methods measure the optical nonlinearity of the medium by measuring the change of the transmitted light, which is not suitable for the medium with low transmittance and the study of the optical nonlinearity of the surface of the medium.

[0004] In response to the above problems, D.V.Petrov et al. proposed a reflection Z-scan method for measuring the optical nonlinearity of the medium surface in 1994 (D.V.Petrov, A.S.L.Gomes, and Cid B.de Arabjo, "Reflection Z-scan technique for measurements of optical properties of surfaces ", Appl.Phy.Lett, 65, 1067 (1994)), however, this method, like the traditional transmission Z-scanning method, requires the movement of the sample in the direction of laser propagation, requires multiple excitations of the laser, and easily damages the surface of the medium ; In addition, due to the measurement of reflected light, the reflective surface has to move during the measurement process, which increases the difficulty of measurement and affects the accuracy of measurement

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