Method for measuring material nonlinearity based on phase object single-pulse reflection

A phase object and reflection measurement technology, applied in the field of nonlinear properties, can solve the problems of low transmittance, increase the difficulty of measurement, and inapplicability of optical nonlinearity, and achieve the effect of high sensitivity and simple optical path.

Inactive Publication Date: 2009-12-23
SUZHOU UNIV
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Problems solved by technology

However, the above-mentioned measurement methods measure the optical nonlinearity of the medium by measuring the change of the transmitted light, which is not suitable for the medium with low transmittance and the study of the optical nonlinearity of the surface of the medium.
[0004] In response to the above problems, D.V.Petrov et al. proposed a reflection Z-scan method for measuring the optical nonlinearity of the medium surface in 1994 (D.V.Petrov, A.S.L.Gomes, and Cid B.de Arabjo, "Reflection Z-scan technique for measur

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  • Method for measuring material nonlinearity based on phase object single-pulse reflection
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  • Method for measuring material nonlinearity based on phase object single-pulse reflection

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Embodiment 1

[0025] See attached Figure 1~3 As shown, a method for measuring material nonlinearity based on single-pulse reflection of a phase object, the incident laser light 1 is divided into two beams by the first beam splitter 2, one beam is the monitoring light, which is recorded by the first detector 3, and the other beam After passing through the phase object 4, it is focused on the sample 6 by the lens 5, and the pulsed light reflected by the surface of the sample 6 is divided into two paths by the second beam splitter 7, one path is directly recorded by the second detector 8, and the other path passes through the A small hole diaphragm 9 whose center coincides with the optical axis enters the third detector 10;

[0026] The specific detection steps are:

[0027] (1) The sample 6 to be tested is placed near the lens 5, and the second detector 8 and the third detector 10 are used to measure the energy of the aperture and the aperture diaphragm 9 respectively, while the first detec...

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Abstract

The invention discloses a method for measuring material nonlinearity based on phase object single-pulse reflection. Incident laser is divided into two beams through a first beam splitter: one beam of light is detecting light recorded by a first detector; the other beam of light passes through the phase object and then is focused on sample to be measured by lens; the intense pulsed light reflected from the surface of the sample to be measured is divided into two beams by a second beam splitter: one beam of light is directly recorded by a second detector; while the other beam of light enters a third detector through a small-holed aperture slot of which the center is coincident with the optical axis. The invention discloses a new method for measuring the optical nonlinearity of medium surface, which realizes the measurement of coefficient of nonlinear refraction and absorption, and can be widely applied in the research field of media interface nonlinear optical measurement and thin-film nonlinear optical measurement.

Description

technical field [0001] The invention relates to a method for measuring the nonlinear properties of materials by using optical means, in particular to a method for measuring the optical nonlinearity of the medium interface reflection based on the single pulse reflection of the phase object and the method for measuring the optical nonlinearity of the thin film by using the reflected light. In the field of linear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, the research on nonlinear optical materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear optical materials. Optical nonlinear measurement technology is one of the key technologies for ...

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Application Information

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IPC IPC(8): G01N21/17G01N21/41
Inventor 宋瑛林税敏李常伟金肖杨俊义
Owner SUZHOU UNIV
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