Measuring method and device

A testing method and testing device technology, applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., can solve the problems of data error, potential difference increase, human error, etc., to reduce the error rate, improve the accuracy, reduce the shape Effects of Variables

Inactive Publication Date: 2010-03-31
BOE TECH GRP CO LTD +1
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Problems solved by technology

When the external voltage is continuously applied to the PCB, the electrons in the direction c of the current movement will continue to gather, such as Figure 8 As shown, it is a schematic diagram of the internal and external electric fields between the two LCD substrates in the prior art. When the test voltage u is applied in the E→F direction, an external electric field d is formed, and the internal electrons between the two LCD substrates gather. , in the F→E direction, an internal electric field e is formed inside the two substrates of the LCD, so that the internal and external electric fields e and d will cancel each other out, so that the voltage of the ITO layer of the lower TFT substrate becomes smaller, resulting in TCO between the ITO layer and the upper color filter substrate. The potential difference between the layers (+6V) increases, which easily causes the polarization of the liqui

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Embodiment Construction

[0027] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.

[0028] In the embodiment of the present invention, the first voltage value, the second voltage value, ..., the N-1th voltage value, and the Nth voltage value are set sequentially from small to large, and according to the Nth voltage value, the first voltage value , the N-1th voltage value, the second voltage value, ... to provide the test voltage to the liquid crystal display panel, so that the liquid crystal molecules will deflect alternately and symmetrically in forward and reverse directions under the action of the test voltage, and play a role in relatively Restoring the deformation of liquid crystal molecules in a short time interval can reduce the error rate of test data, improve the accuracy of VT curve, and provide high-precision data for gamma tuning. At the same time, one tester can control The test device co...

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Abstract

The present invention discloses a test method and a test device, and the test method comprises setting a series of voltage values which are a first voltage value, a second voltage value, ..., a (N-1)th voltage value, an Nth voltage value from small to big, providing test voltages to a liquid crystal display panel, wherein, the test voltages are the Nth voltage value, the first voltage value, the (N-1)th voltage value, the second voltage value, ...; measuring a transmittance rate of the liquid crystal display panel under the test voltage value respectively. Under the function of the test voltage, liquid crystal molecules are alternately symmetric and deflected for/backward, deformation of the liquid crystal molecules can be recovered in a short time, data test error can be reduced, accuracyof a VT curve can be improved, and data with higher precision can be provided for Gamma tuning.

Description

technical field [0001] The invention relates to performance testing of liquid crystal display panels, in particular to a testing method and device for voltage and transmittance curves. Background technique [0002] With the advent of the digital age, the comprehensive popularization of liquid crystal displays (Liquid Crystal Display, LCD for short) will become an inevitable trend in the development of the digital age. [0003] At present, the liquid crystal display panel is to install the liquid crystal between two substrates with fine grooves, so that the fine grooves on the two substrates intersect perpendicularly at 90 degrees. The upper substrate is called a color filter substrate, and its inner surface is deposited with a transparent conductive oxide (Transparent Conductive Oxide, referred to as TCO) layer as a transparent electrode (also called a common electrode); the lower substrate is called a thin film transistor (Thin Film Transistor, referred to as TFT) ) substr...

Claims

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Application Information

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IPC IPC(8): G02F1/13G01R31/00
Inventor 黄婕妤于洪俊吴昊
Owner BOE TECH GRP CO LTD
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