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Sampling device for analyzer and sampling analysis and control method

A sampling device and sampling analysis technology, applied in sampling devices, testing water, material inspection products, etc., can solve the problems of reducing energy consumption, high price, unfavorable cost saving, etc., and achieve the effect of saving investment cost and maintenance cost

Inactive Publication Date: 2010-05-05
湖南骏泰新材料科技有限责任公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the price of imported analyzers is very expensive, and in actual application, the measurement of process parameters does not require continuous measurement, and the analytical instruments have not achieved a good use value, which is not conducive to saving costs and reducing energy consumption.

Method used

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  • Sampling device for analyzer and sampling analysis and control method
  • Sampling device for analyzer and sampling analysis and control method
  • Sampling device for analyzer and sampling analysis and control method

Examples

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Embodiment

[0026] Such as figure 2 As shown, this embodiment provides a sampling device for a water quality analyzer, including a sampling tank 1 and a sampling pipeline, wherein the sampling tank 1 is in the shape of an inverted cone with a wide top and a narrow bottom, with a taper of 10.5° and a bottom-to-height ratio of 0.275 . Described sampling pipeline comprises the branch pipeline 2 that multiple roads independently access this sampling tank 1, and each branch pipeline 2 in described sampling pipeline is provided with the sampling electromagnetic valve 3 that is connected with controller respectively; Described sampling tank bottom is provided with Connect to the discharge valve 8 of the discharge pipe. The outlets of the sampling pipelines are arranged at a distance ratio of 0.1 to 0.5 between the top and the bottom. The angle between the liquid flow direction and the radial direction is less than 90°, and the liquid flow direction is horizontal and slightly downward. The to...

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Abstract

The invention provides a sampling device for an analyzer and a sampling analysis and control method. The sampling device for the analyzer comprises a sampling tank and a sampling pipeline, wherein the sampling pipeline comprises a plurality of paths of branch pipelines which are independently connected into the sampling tank, and each branch pipeline in the sampling pipeline is respectively provided with a sampling valve connected with a controller; and a sample discharging valve which is connected into a liquid discharging pipeline is arranged at the bottom of the sampling tank. The sampling analysis and control method corresponding to the sampling device for the analyzer automatically controls the switches of the sampling valve and the sample discharging valve through the controller according to the preset sequence and time to achieve the purpose of sampling measurement of a plurality of process point parameters by using one analyzer and one sampling tank, thereby effectively reducing investment cost, maintenance cost and production energy consumption.

Description

Technical field: [0001] The invention relates to the field of industrial automation control, in particular to a sampling device of an analyzer and a sampling analysis control method. Background technique: [0002] Analytical instruments for on-line measurement are widely used in the chemical industry. At present, analytical instruments for routine use are generally imported from abroad. However, each imported analytical instrument adopts single-point single instrument measurement. For each additional set of online measurement points 6, it is necessary to add an analyzer 4 and a sampling tank 1, and perform corresponding sampling analysis by opening the manual sampling valve 7. , greatly increasing production costs and maintenance costs. [0003] For example, if figure 1 As shown, the chemical water treatment production line is equipped with on-line silicon analyzers and hardness analyzers. According to the conventional design, each silicate ion and hardness measurement po...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/10G01N33/18
Inventor 谢永红胡向荣孙勇刘卫国安建平石大五丁豫湘李东杰
Owner 湖南骏泰新材料科技有限责任公司
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