Electronic diffraction index calibrating method based on Matlab

Abstract

The invention belongs to the field of scientific analysis of materials, in particular to an electronic diffraction index calibrating method based on Matlab. The zero-order electronic pattern index calibration and the index calibration of electronic simulating diffraction spots of two substances with a specific orientation relationship are carried out on a sample material by using a transmission electronic microscope, a computer and Matlab software. The invention mainly relates to a calibrating method of a monocrystal diffraction spectrum and the drawing of a standard electronic diffraction spectrum. Compared with the traditional calibrating method, the invention saves more time, can conveniently draw a zero-order and high-order simulating spot chart and an orientation relationship chart of a second phase and a base body and provides the beneficial technical basis for the computer to recognize the monocrystal diffraction spectrum.

Description

technical field

[0001] The invention relates to a calibration method for an electron diffraction index, in particular to a Matlab-based electronic diffraction index calibration method, which belongs to the field of material science analysis. Background technique

[0002] 1. Basic concepts

[0003] 1.1 Electron diffraction pattern

[0004] The commonly seen electron diffraction patterns can be divided into single crystal diffraction spectrum and polycrystalline single diffraction ring composed of spot arrangement. Single crystal electron diffraction spectrum is divided into zero-order Laue electron diffraction spectrum and high-order Laue electron diffraction spectrum. The index (hkl) of the zero-order Laue diffraction spot or reciprocal lattice point should satisfy the crystal band law (h*u+k*v+l*w=0). The zero-order Laue spot diffraction spectrum is a very useful diffraction information, which can be used not only to identify the phase, but also to estimate the thickness...

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