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Electronic diffraction index calibrating method based on Matlab

A technology of electronic diffraction and calibration method, which is applied in the direction of electrical digital data processing, material analysis using radiation diffraction, special data processing application, etc., can solve the problem that the method of electronic diffraction pattern calibration is blank, and achieve the effect of saving time

Inactive Publication Date: 2010-05-19
CHONGQING UNIV
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Problems solved by technology

However, the method of using Matlab programming to calibrate the electronic diffraction pattern is still blank at home and abroad.

Method used

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  • Electronic diffraction index calibrating method based on Matlab
  • Electronic diffraction index calibrating method based on Matlab
  • Electronic diffraction index calibrating method based on Matlab

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Embodiment Construction

[0034] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0035] A Matlab-based electronic diffraction index calibration method is carried out by using a transmission electron microscope (TEM), a computer and Matlab software.

[0036] 1. Zero-order electron diffraction pattern index calibration

[0037] First obtain the electron diffraction pattern photo of the sample by TEM, import the obtained diffraction pattern photo into the image processing software at a ratio of 1:1, and measure the two shortest diffraction vectors R of the characteristic parallelogram in the diffraction spectrum in the photo 1 and R 2 and their angle θ, such as figure 1 As shown; the image processing software for measurement can be commonly used software such as Autocad and Potoshop; then, query relevant materials and manuals to obtain the camera constant K of the transmission electron microscope and the lattice constant of ...

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Abstract

The invention belongs to the field of scientific analysis of materials, in particular to an electronic diffraction index calibrating method based on Matlab. The zero-order electronic pattern index calibration and the index calibration of electronic simulating diffraction spots of two substances with a specific orientation relationship are carried out on a sample material by using a transmission electronic microscope, a computer and Matlab software. The invention mainly relates to a calibrating method of a monocrystal diffraction spectrum and the drawing of a standard electronic diffraction spectrum. Compared with the traditional calibrating method, the invention saves more time, can conveniently draw a zero-order and high-order simulating spot chart and an orientation relationship chart of a second phase and a base body and provides the beneficial technical basis for the computer to recognize the monocrystal diffraction spectrum.

Description

technical field [0001] The invention relates to a calibration method for an electron diffraction index, in particular to a Matlab-based electronic diffraction index calibration method, which belongs to the field of material science analysis. Background technique [0002] 1. Basic concepts [0003] 1.1 Electron diffraction pattern [0004] The commonly seen electron diffraction patterns can be divided into single crystal diffraction spectrum and polycrystalline single diffraction ring composed of spot arrangement. Single crystal electron diffraction spectrum is divided into zero-order Laue electron diffraction spectrum and high-order Laue electron diffraction spectrum. The index (hkl) of the zero-order Laue diffraction spot or reciprocal lattice point should satisfy the crystal band law (h*u+k*v+l*w=0). The zero-order Laue spot diffraction spectrum is a very useful diffraction information, which can be used not only to identify the phase, but also to estimate the thickness...

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Application Information

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IPC IPC(8): G01N23/20G06F17/50
Inventor 文波任莉平左汝林李小飞刘文彬
Owner CHONGQING UNIV
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