Self-adaptive scanning device with electromagnetic compatibility for near-field test

Abstract

The invention relates to a self-adaption scanning device with electromagnetic compatibility for a near-field test, which consists of a hardware system and a scanning control software system. The hardware system comprises a computer, a spectrum analyzer, a GPIB card for communication between the computer and the spectrum analyzer, a set of near-field probe and pre-amplifier, a control circuit witha single-chip computer as the core, a USB serial cable for connection of the computer and the control circuit, two sets of stepper motor and matching transmission devices and also a three-dimensionalmechanical scanning platform; the scanning control software system comprises a communication program between the computer and the spectrum analyzer, a serial communication program between the computer and the single-chip computer, a driving program for the single-chip computer to control the stepper motor, a program for analysis and display of data and a user-oriented human-computer interaction interface program. The invention has the advantages of scientific concept and novel structure, improves the scanning efficiency and the data accuracy, and has high practical value and broad applicationprospects in the field of testing of the near field with electromagnetic compatibility.

Description

(1) Technical field [0001] The present invention relates to an adaptive scanning device for electromagnetic compatibility testing, in particular to an adaptive scanning device for electromagnetic compatibility for near-field testing, which can scan chips, printed circuit boards (PCBs), cables, Electromagnetic scanning is performed on electronic components and equipment such as the chassis, and the test results are output according to the test data, and the electromagnetic radiation map can be intuitively displayed with a colored spatial distribution map, so as to realize the "visualization" of electromagnetic radiation, which is helpful for technicians to find out the radiation position Carry out troubleshooting. The invention belongs to the field of electromagnetic compatibility near-field testing. (2) Background technology [0002] The so-called Electromagnetic Compatibility (Electromagnetic Compatibility, abbreviated as EMC) refers to: "Equipment and system can perform t...

AI Technical Summary

Problems solved by technology

The advantage of this scanning system is that it can obtain the complete electromagnetic field information of the measured object in one measurement, and can quickly and accurately locate the source of electromagnetic interference; the disadvantage is that on the one hand, the test accuracy and accuracy of products with irregular outer contours or products with more complex structures will be affected. Greatly reduced, on the other hand, because some flatbed scanners use array probes as high as 1280, so its cost is very high

However, in the mechanical scanners on the market, the probe moves at a fixed step length during operation, and it cannot be changed during operation.

In this way, when the initial step length is set relatively small, if the electromagnetic radiation value in a certain area does not change much during the scanning process, unnecessary scanning will be caused, resulting in a waste of time

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