Universal circuit testing method

Abstract

The invention relates to a universal circuit testing method, which solves the technical problem of synchronous analysis of multi-channel collected data of the circuit to be tested. In the technical scheme, the method is realized through a mobile portable testing terminal and a remote analyzer which are connected through a network interface, wherein the signal input interface of the mobile portable testing terminal is correspondingly connected with the testing port of a circuit to be tested and is used for transmitting digital signals or waveform signals, processing and storing the signals and transmitting the processed signals to the central processing unit of the remote analyzer through a wireless network, and the remote analyzer is used for synchronous and real-time analysis of the received signals and displaying results on the display. The invention realizes the synchronous analysis of the equipment state at a time through the multi-channel input, and improves the system efficiency due to the utilization of independent computer systems respectively for data collection, data management and data analysis. Moreover, the invention realizes the local processing of simple testing signals and the remote processing of complex circuit states, and ensures that the testing continuity can not be affected even when the maintenance personnel are away from the testing environment.

Description

technical field [0001] The invention belongs to the field of analysis and test of general electrical characteristics of 0-3000HZ, and relates to a test method which has the functions of a multimeter and an oscilloscope and realizes the separation of test and processing analysis. Background technique [0002] At present, multimeters or oscilloscopes are generally used to test circuit characteristics, which can satisfy the analog or switching values ​​of small circuits, but for large, complex circuits, and even networking circuits, only a certain point and ground, or a certain segment can be tested. Analog quantities such as voltage, instantaneous current, power, and resistance between circuits have no effect on analyzing the state of the circuit. For these circuits, it is necessary to simultaneously sample and process each quantity at the same time, and then through some complex calculations. Obtaining the working state of the circuit brings great difficulties to those skille...

AI Technical Summary

Problems solved by technology

[0002] At present, multimeters or oscilloscopes are generally used to test circuit characteristics, which can satisfy the analog or switching values ​​of small circuits, but for large, complex circuits, and even networking circuits, only a certain point and ground, or a certain segment can be tested. Analog quantities such as voltage, instantaneous current, power, and resistance between circuits have no effect on analyzing the state of the circuit. For these circuits, it is necessary to simultaneously sample and process each quantity at the same time, and then through some complex calculations. Obtain the working state of the circuit, which brings great difficulties to those skilled in the art

First of all, it is impossible to use tools such as multimeters to collect data at the same time; secondly, the collected data requires a lot of calculations. Although small portable computers have appeared on the market, it is very inconvenient to carry; personnel, and it is impossible to bring large test equipment with you