Reflective spectral measurement sampling method for jewelry or jewel detection

Abstract

The invention discloses a reflective spectral measurement sampling method for jewelry or jewel detection, which comprises the following steps of: A, projecting incident light onto a sample; B, reflecting the incident light through the sample; C, distributing the light reflected from the sample inside an integrating sphere through mirror or diffuse reflection; and D, acquiring the reflected light passing through the integrating sphere in the step C from the bottom or the lateral surface. Through perpendicular incidence or diffuse reflection of the integrating sphere during reflecting the incident light and sampling, the reflective spectral measurement sampling method for the jewelry or jewel detection effectively acquires 'full light' information of a wavelength range selected by a user, solves the problem of uncertainty in a natural shape sample measurement process, saves the fussy operation steps of monochrome scanning, mechanical light splitting and the like, and greatly improves the analysis and test efficiency of the jewelry or jewel detection. The reflective spectral measurement sampling method for the jewelry or jewel detection is widely applied in the jewelry appraisal industry.

Description

technical field [0001] The invention relates to a method for identifying and measuring jewelry or gemstones, in particular to a reflection measurement spectrum sampling method for jewelry or gemstone detection. Background technique [0002] At present, the requirements for jewelry appraisal work are getting higher and higher, and with the rapid development of jewelry man-made technology, the difficulty of jewelry appraisal work is also increasing. Jewelry appraisal usually has the following five detection methods: 1. Visual inspection method (color, shape, luster, cleavage, etc.); 2. Physical property test method (relative density, refractive index, hardness); 3. Crystal optics 4. Chemical component analysis (simplified chemical analysis, chemical total analysis, electronic probe component analysis, etc.); 5. Crystal structure analysis (X-ray diffraction analysis, infrared spectroscopy, electron probe analysis, etc.) needles, Raman spectrometers, gemstone spectroscopes, UV ...

AI Technical Summary

Problems solved by technology

In order to achieve continuous recording of photometric values ​​at different wavelengths, it is necessary to rotate and adjust the mechanical device. To ensure the wavelength resolution, the scanning time needs to be extended, the measurement speed is slow, and the efficiency is low.

At the same time, due to the use of precision mechanical rotating devices, the existing measuring instruments have high requirements for debugging and installation, resulting in complicated instrument technology and high cost

This measurement method obviously cannot fully adapt to the current development trend of the jewelry testing industry.

Images