Reflectance spectrum measuring and sampling system and method used for jewel detection

Abstract

The invention discloses a reflectance spectrum measuring and sampling system and a reflectance spectrum measuring and sampling method used for jewel detection. The reflectance spectrum measuring and sampling system comprises a first light source, a second light source, a light filtration element, an integrating sphere, an optical fiber, a spectral detection module, an analog-digital conversion module and a data processing terminal, wherein the integrating sphere has an incidence hole, a sampling port and a reflected light outgoing port. The reflectance spectrum measuring and sampling system can collect a real-time spectrum of light rays reflected by a jewel, and can efficiently obtain the full light information within the wavelength scope selected by a user, thereby solving the uncertain problems existing in the following sample measurement process, omitting the complex operation steps, such as the monochrome scanning and mechanical light splitting, and greatly improving the efficiency of a jewel detection and analysis test. The reflectance spectrum measuring and sampling system and the reflectance spectrum measuring and sampling method which have favorable performances can be widely applied to the jewel identification industry.

Description

technical field [0001] The invention relates to a gemstone identification system and method, in particular to a reflection spectrum measurement sampling system and method for gemstone detection. Background technique [0002] At present, the requirements for gem identification work are getting higher and higher, and with the rapid development of gem man-made technology, the difficulty of gem identification work is also increasing. Gem identification usually has the following five detection methods: 1. Visual observation identification method (color, shape, luster, cleavage, etc.); 2. Physical property test identification method (relative density, refractive index, hardness); 3. Crystal optics 4. Chemical component analysis (simplified chemical analysis, chemical total analysis, electronic probe component analysis, etc.); 5. Crystal structure analysis (X-ray diffraction analysis, infrared spectroscopy, electron probe analysis, etc.) needles, Raman spectrometers, gemstone spec...

AI Technical Summary

Problems solved by technology

In order to achieve continuous recording of photometric values ​​at different wavelengths, it is necessary to rotate and adjust the mechanical device. To ensure the wavelength resolution, the scanning time needs to be extended, the measurement speed is slow, and the efficiency is low.

At the same time, due to the

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