Semiconductor structure and forming method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- INST OF MICROELECTRONICS CHINESE ACAD OF SCI
- Publication Date
- 2010-10-20
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
Technical field
[0001] The present invention relates to the technical field of semiconductor manufacturing, in particular to a TFET (Tunneling FET, tunneling field effect transistor) structure and a method of forming the same. Background technique
[0002] As the size of the MOSFET (Metal Oxide Semiconductor Field Effect Transistor) continues to shrink, the traditional MOSFET structure can no longer meet the increasingly high requirements. Therefore, a TFET is proposed to meet the ever-increasing requirements of device switching performance.
[0003] When a certain turn-on voltage is applied to the gate of the TFET, due to the quantum tunneling effect, the barriers on the source and drain regions on both sides of the channel region become smaller, so that the source and drain regions are quickly turned on.
[0004] With the development of semiconductor technology, there is an urgent need to further reduce the turn-on voltage of the gate to meet the rapidly increasing requirements fo...