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In-situ monitoring device for non-metal material outgassing pollution of optical surfaces of spacecrafts

A non-metallic material, optical surface technology, applied in the aerospace field, can solve the problems of in-situ quantification of deposition amount, non-metallic material outgassing pollution, etc., achieve stable and reliable test process, reduce the risk of on-orbit use, and increase accuracy. Effect

Active Publication Date: 2013-06-26
NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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Problems solved by technology

[0007] The purpose of the present invention is to solve the problem that the amount of deposition on the optically sensitive surface of non-metallic materials used by my country's existing spacecraft cannot be quantified in situ during the thermal vacuum test and on-orbit operation of the spacecraft. In-situ monitoring device for air pollution from non-metallic materials

Method used

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  • In-situ monitoring device for non-metal material outgassing pollution of optical surfaces of spacecrafts

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Embodiment

[0034] figure 1 It is a schematic diagram of an in-situ monitoring device for outgassing pollution of non-metallic materials on the optical surface of a spacecraft of the present invention, wherein 1-test unit cabinet, 2-vacuum pumping system, 3-vacuum chamber, 4-optical sample, 5- -quartz crystal microbalance detector, 6-spectrophotometer, 7-spectrophotometer monitoring window, 8-thermal control sample stage, 10-quartz crystal microbalance monitoring computer, 11-cabinet.

[0035] 1) Put 100g of 1mm×1mm×1mm granular space-grade silicone rubber into the thermal control sample stage 8, adjust the angle of view between the quartz crystal microbalance detector 5 and the thermal control sample stage 8 to be 180°, connect water, electricity and gas equipment, and adjust The quartz crystal microbalance monitors the computer 10 communication, and closes the vacuum chamber 3;

[0036] 2) Adjust the spectrophotometer so that the light beam in the spectrophotometer is incident on the o...

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Abstract

The invention relates to an in-situ monitoring device for non-metal material outgassing pollution of optical surfaces of spacecrafts, belonging to the technical field of aerospace. The device comprises a test unit cabinet, a vacuum pumping system, a vacuum bin, optical samples, a quartz crystal microbalance detector, a spectrophotometer, a spectrophotometer window, a thermal control sample stage,a spectrophotometer monitoring window, a quartz crystal microbalance monitoring computer and an equipment cabinet. A method is high in sensitivity (1.10*10<-9>-4.42*10<-9>), stable and reliable in test process, good in repeatability and suitable for large-scale test.

Description

technical field [0001] The invention relates to an in-situ monitoring device for outgas pollution of non-metallic materials on the optical surface of a spacecraft, belonging to the technical field of aerospace. Background technique [0002] In recent years, the impact of spacecraft molecular contamination on satellite optical payload systems has received much attention. Due to the long life of the satellite and the high performance of the payload, such as the use of sensors with lower and lower operating temperatures and the use of high-power electronic devices, the degree of control over molecular pollution has increased accordingly. Molecular contamination caused by outgassing of materials in a vacuum environment is one of the main sources of contamination. The performance degradation of satellite sensitive optical surfaces is the main effect caused by outgassing molecular contamination, so molecular contamination on optical surfaces must be monitored and controlled in sit...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N5/00
Inventor 颜则东王先荣王鷁姚日剑柏树冯杰
Owner NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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