Low-temperature physical property measuring device of solid material

Abstract

The invention relates to a low-temperature physical property measuring device of a solid material, which is used for measuring specific heat, alternating current and direct current resistivity, a heat conduction coefficient and a thermoelectric potential rate of a solid material at low temperature. The physical property measuring device comprises a sample carrying part and a refrigerating part, wherein the refrigerating part comprises a Dewar flask, a Dewar sleeve, a Dewar cover, a low-temperature chamber, a vacuum extracting module and an air leakage preventing module; the Dewar flask is arranged in the Dewar sleeve; the Dewar sleeve and the Dewar cover are fastened in a flange structure; the middle of the Dewar cover is provided with a hole in which the low-temperature chamber is inserted; and the middle of the low-temperature chamber is sleeved with a blocking sleeve for fixing the low-temperature chamber. The jointing position of a sample rod and the low-temperature chamber has a flange structure, and the air leakage preventing module and the vacuum extracting module are clamped between the sample rod and the low-temperature chamber from bottom to top and sealed by an O-shaped ring. An aviation plug is installed on the upper part of the sample rod, and an internal lead is connected to the aviation plug along a rod body of the sample rod. The invention has the advantages of less liquid nitrogen consumption, no indium wire consumption, short thermal relaxation time, stable low-temperature environment, relatively simple structure, low cost, and the like and can be applied to the physical property measurement of various solid materials in the teaching and researching process.

Description

technical field [0001] The invention relates to a device for measuring the physical properties of solid materials at low temperature, which is used for measuring the specific heat, AC and DC resistivity, thermal conductivity and thermoelectric potential of solid materials at low temperature, and belongs to the field of low temperature physical property measurement. Background technique [0002] The specific heat, AC and DC resistivity, thermal conductivity and thermoelectric potential of solid materials at low temperature are very important physical parameters, and it is of great significance to obtain the above parameters accurately, quickly and in a low-cost method. [0003] In the past, to measure the above parameters, it was necessary to design a measurement scheme and build a measurement circuit separately, which was inefficient, time-consuming and cumbersome. Since then, some systematic products have appeared on the market, such as the variable temperature and magnetic...

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Problems solved by technology

[0004] However, these products generally adopt a circulating refrigeration device, that is, the sample is placed in an environment surrounded by a heat pipe, and liquid nitrogen or liquid helium is extracted from the Dewar and circulated in the heat pipe, and finally returns to the Dewar. The disadvantage of this method is that the consumption of liquid nitrogen is large, the quality requirements for the catheter are high, and the sealing at low temperature requires precious metal indium, the structure is complicated, and the cost is too high

[0005] Moreover, the measurement methods of these products are too complicated, so the requirements for supporting equipment are high, and it is not applicable in some occasions with low precision requirements

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