System and method for realizing total internal reflection fluorescence microscopy by using concentric double conical surface lens
A total internal reflection, biconical surface technology, used in microscopy, fluorescence/phosphorescence, optics, etc., can solve problems such as low transmittance, and achieve the effect of weak light damage, weak light bleaching, and convenient switching.
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Embodiment 1
[0051] Example 1: Figure 4 The apparatus of the present invention compares the imaging experiments of wide-field fluorescence microscopy and total internal reflection fluorescence microscopy on fluorescent beads with a diameter of 1 μm. The scale is 10 μm, the microscopic objective lens in the experiment is 63X, NA=1.4, and the laser is frequency-doubled YAG laser with a wavelength of 532nm. During the experiment, adjusting the relative position of the convex axicon 8 in the concave axicon 7 can realize the switching between the total internal reflection fluorescence microscope and the wide-field fluorescence microscope. Figure 4 (a) is a wide-field fluorescence microscope image, where the background noise caused by the fluorescent beads at the out-of-focus position can be seen. Figure 4 (b) is a total internal reflection fluorescence microscope image, only the fluorescent spheres at the focal plane can be seen, and the contrast is very high.
Embodiment 2
[0052] Example 2: Figure 5 The apparatus of the present invention compares the imaging experiments of wide-field fluorescence microscopy and total internal reflection fluorescence microscopy on lily of the valley slices. The scale is 10 μm, the microscopic objective lens in the experiment is 100X, NA=1.45, and the laser is frequency-doubled YAG laser with a wavelength of 532nm. During the experiment, adjusting the relative position of the convex axicon 8 in the concave axicon 7 can realize the switching between the total internal reflection fluorescence microscope and the wide-field fluorescence microscope. Figure 4 (a) is a wide-field fluorescence microscopy image, where the autofluorescence of the sample at the out-of-focus position can be seen. Figure 4 (b) is a total internal reflection fluorescence microscope image, only the fluorescence signal at the interface can be seen, and the image contrast is very high.
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