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Device for testing integrated triode array circuit

A technology for circuit testing and triodes, applied in the field of testing methods and devices for integrated triode array circuits, to achieve the effects of improving work efficiency, short testing time, and fast testing speed

Active Publication Date: 2011-06-15
EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a test device for integrated triode array circuit in order to solve the problem of full tube and full parameter test of integrated triode array circuit and the test of tube parameters at high and low temperature

Method used

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  • Device for testing integrated triode array circuit
  • Device for testing integrated triode array circuit
  • Device for testing integrated triode array circuit

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Experimental program
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Embodiment Construction

[0028] Below in conjunction with accompanying drawing, preferred embodiment of the present invention is described in further detail:

[0029] like figure 1 As shown, the integrated triode array circuit testing device provided by the present invention is composed of an operation display unit, a host unit and an adapter, and the operation display unit and the host unit are connected through the adapter.

[0030] The operation display unit is composed of a display circuit, a selection button, a device under test fixture and a set of instruments;

[0031] The host unit is composed of a single-chip microcomputer, an AD converter, a switch matrix common channel, at least one switch matrix unit, a regulated power supply, a constant current source and a signal processing circuit;

[0032] In the host unit, the single-chip microcomputer first judges the test mode (that is, single-step or continuous), the test temperature condition (that is, high temperature, low temperature and normal...

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Abstract

The invention relates to a device for testing an integrated triode array circuit, which comprises a testing box in a two-layer split type structure, wherein the lower layer is mainly provided with a singlechip, an AD (Analog-to-Digital) converter, a relay, an analog switch, a stabilized voltage power supply, a constant current source, an operational amplifier and an adapter; the upper layer is mainly provided with a nixie tube, a switch, a select key, a tested circuit clamp, a light-emitting diode, a buzzer and a universal instrument interface; and an upper layer circuit and a lower layer circuit are connected through the adapter. The testing box is the core part of the device; data acquisition, data processing, data judgment and interface functions are realized mainly through a lower layer plate of the testing box; and signal input and output, judgment result displaying, parameter testing data displaying and judgment step displaying functions are realized mainly through an upper layer plate of the testing box. The device provided by the invention can be used for completing single-step and automatic tests of all tubes and parameters as well as high temperature, low temperature and normal temperature tests.

Description

technical field [0001] The invention belongs to the field of semiconductor integrated circuit testing, in particular to a testing method and device for an integrated triode array circuit. Background technique [0002] At present, two types of test devices are mainly used for crystal triodes, which are semiconductor graphic analyzers (such as domestic ladder graphic analyzers, 4200-SCS semiconductor characteristic analyzers made in the United States, etc.) and semiconductor discrete device testers. One semiconductor tracer adopts a manual test and analysis method, mainly performing parameter analysis on a single parameter. The engineering test is very cumbersome, requiring the operator to select the X-axis, Y-axis and step signal. When testing a parameter of the crystal triode, it is necessary to repeatedly set multiple instrument indicators, and the test results need to be calculated, which is not intuitive. At present, the device mainly It provides analysis data for semico...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/26
Inventor 焦贵忠田波方岚徐春叶
Owner EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
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