Method for testing complex dielectric constant of microwave dielectric material

A microwave dielectric material and complex permittivity technology, which is applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as cumbersome assembly process, difficult operation, and limited test frequency range

Inactive Publication Date: 2011-07-06
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Commonly used resonant cavities include rectangular cavities and cylindrical cavities, etc., but when testing in the microwave low frequency band, the test cavity is too large, resulting in large cavity and sample processing, heavy weight, and difficult to operate. narrow frequency range
For the stripline resonator method GB/T12636-90, which is mainly used to test low-loss microwave dielectric materials in the low-frequency band, two pieces of dielectric materials nee...

Method used

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  • Method for testing complex dielectric constant of microwave dielectric material
  • Method for testing complex dielectric constant of microwave dielectric material
  • Method for testing complex dielectric constant of microwave dielectric material

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Embodiment Construction

[0051] As described in the aforementioned technical scheme, first process the microwave dielectric rectangular sheet to be tested, and then prepare the dielectric material support block and the metal conduction band to form a figure 2 After the double-sided parallel strip line resonator shown in 3, a test system is built, and finally various known parameters and measurement parameters are input into the computer, and the complex dielectric constant of the microwave dielectric material to be tested is obtained through programming calculation.

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Abstract

The invention relates to a method for testing the complex dielectric constant of microwave dielectric material and belongs to the field of microwave testing technology. The method comprises the following steps: firstly, processing the microwave dielectric material to be measured into a rectangular thin slice with two parallel surfaces and simultaneously preparing two dielectric material supporting blocks and two metal conduction strips, then forming a double-sided parallel strip line resonator, inputting a microwave frequency sweep test signal into the double-sided parallel strip line resonator through a coaxial coupling probe, measuring the resonant frequency fr and the loaded quality factors QL after the microwave frequency sweep test signal passes through the double-sided parallel strip line resonator and combing the known parameters (Relevant dimension, complex dielectric constants of the dielectric material supporting blocks and the like) to calculate the complex dielectric constant of the microwave dielectric material to the measured. The method has the advantages of wide working frequency band, small volume of a test device, good mixed mode rejection, small test error and the like and is convenient to use. The invention can realize the wide-scope, accurate and quick noninvasive measurement to the complex dielectric constant of the microwave dielectric material within the scope of each microwave frequency band.

Description

technical field [0001] The invention belongs to the technical field of microwave testing, and relates to a method for testing the complex dielectric constant of microwave dielectric materials, in particular to a method for testing the complex dielectric constant of microwave dielectric materials based on double-sided parallel stripline resonators. Background technique [0002] Microwave low-loss dielectric material is an indispensable multifunctional material in radar communication, microwave circuit, microwave antenna, radome and various microwave components, and its complex dielectric constant must be known when it is designed and used. The complex permittivity is the main basis for evaluating the performance of microwave dielectric materials, and it is also an important parameter for studying the electrical properties of materials. Therefore, it is of great significance to quickly and accurately test the complex permittivity of materials in a wide frequency range. [0003...

Claims

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Application Information

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IPC IPC(8): G01R27/26
Inventor 李恩郭高凤周杨高源慈陶冰洁
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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