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Method and device for generating restriction facula in STED (Stimulated Emission Depletion) microscopy

A technology of stimulated emission loss and microscope, applied in microscopes, optics, optical components, etc., can solve the problems of difficulty in preparing circular vortex phase plates, and achieve the effects of simple structure, simple manufacturing process and cost reduction.

Inactive Publication Date: 2011-07-13
ZHEJIANG UNIV
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Problems solved by technology

However, the disadvantage of the existing method is that it is very difficult to prepare a 0-2π circular vortex phase plate

Method used

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  • Method and device for generating restriction facula in STED (Stimulated Emission Depletion) microscopy
  • Method and device for generating restriction facula in STED (Stimulated Emission Depletion) microscopy
  • Method and device for generating restriction facula in STED (Stimulated Emission Depletion) microscopy

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Embodiment Construction

[0037] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments, but the present invention is not limited thereto.

[0038] Such as figure 1 The setup for suppressing the spot in a STED microscope is shown, consisting of:

[0039] Laser 1, tangential polarization converter 2, 0 / π four-quadrant phase plate 3, high numerical aperture apochromatic lens 4, fluorescent sample 5.

[0040] The incident light emitted by the laser 1 is converted into tangentially polarized light by a tangential polarization converter 2 . The wavelength of the incident light is determined by the fluorescence absorption and emission spectra of the sample observed by the STED microscope. The characteristics of tangentially polarized light are as figure 2 As shown, the polarization direction of each point is along the tangent direction, and the polarization directions of all points form a vortex. The light polarization direction of each poin...

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Abstract

The invention discloses a method and device for generating a restriction facula in an STED (Stimulated Emission Depletion) microscopy. The method is based on a 0 / pai four-quadrant phase plate for focusing, obtains a hollow focused facula close to the focus of a microscope objective lens by integrating and using tangential polarized light as the restriction facula and is used for three-dimensional super-resolution imaging in a pulse or continuous STED microscopy. The device comprises a laser, a space light regulator, a 0 / pai four-quadrant phase plate and a focusing device which are arranged on a coaxial light path. The device has a simple structure and low cost, can decrease the working power of the STED microscopy under the condition of ensured resolution and prevents damaging an observed sample due to the bleaching action of overstrong laser.

Description

technical field [0001] The invention relates to stimulated emission depletion microscopy technology, in particular to a method and device for generating suppressed light spots in a stimulated emission depletion microscope. Background technique [0002] In recent years, with the introduction of Stimulated Emission Depletion (STED) microscopy (STED for short), the resolution of far-field optical microscopy imaging has been greatly improved, and nanometers can be seen on living cells. scale protein. It is a far-field fluorescence microscopy technique that physically breaks the limit of diffractive optics. The specific principle is: use a laser beam to focus on the sample surface to produce a solid small spot, only excite the fluorescent group at one point to make it fluoresce, and then use another laser beam to focus on the same position on the sample surface to produce a donut-like spot. The hollow spot suppresses the fluorescence intensity around that point, so that only th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B27/48G02B21/08
Inventor 匡翠方郝翔李旸晖刘旭
Owner ZHEJIANG UNIV
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