Method for preparing rust layer sample for being observed by scanning electron microscope

Abstract

The invention discloses a method for preparing a rust layer sample for being observed by a scanning electron microscope, which comprises the following steps of: a, sampling, i.e. cutting a test sample with a rust layer into two small test samples; b, carrying out spot welding, i.e. stacking the two small test samples, carrying out spot welding between the two small test samples and reserving at least one side edge which is not subjected to spot welding; c, grouting, i.e. pouring conductive silver paste into a space between the two small test samples, so that the conductive silver paste is fulfilled between the two small test samples; and d, grinding and polishing to obtain the rust layer sample for being observed by the scanning electron microscope. The rust layer test sample prepared by the method disclosed by the invention is supported by spot welding positions, so that the rust layer is avoided being squeezed by embedding of high temperature molten resin and the original appearanceof the rust layer can be furthest kept. Meanwhile, the whole test sample is an electrical conductor, so that the whole test sample is more beneficial for being observed for a long time by the scanning electron microscope without causing charge accumulation and the accurate of a measurement result can be ensured.

Description

technical field [0001] The invention relates to a metallographic sample for scanning electron microscope observation, in particular to a rust layer sample preparation method for scanning electron microscope observation. Background technique [0002] When studying the corrosion resistance of steel materials, it is usually necessary to analyze and characterize the corrosion products (ie rust layer) of steel materials in order to understand the corrosion mechanism of steel materials. Observing the cross-section of the rust layer with a scanning electron microscope and analyzing the distribution of alloy elements in the cross-section is an important analysis method for studying the rust layer. [0003] Scanning electron microscope (abbreviated as scanning electron microscope, SEM) uses a finely focused electron beam to scan point by point on the sample surface, and interacts with the sample to generate various physical signals. These signals are received by the detector, amplifi...

AI Technical Summary

Problems solved by technology

[0009] The rust layer sample prepared by this method has the following disadvantages when used for scanning electron microscope observation: when inlaying, the high-temperature molten resin will squeeze the rust layer, thereby affecting the observation of the original appearance of the rust layer; , because the resin used for inlaying is not conductive, it needs to be pasted on the aluminum sample holder with conductive glue, which does not have much effect on the short-term morphology observation, but when performing elemental analysis or electron backscattering During diffraction (EBSD) analysis, due to the electron beam irradiation time is too long, it will cause charge accumulation, discharge or image drift, which will affect the accuracy of measurement

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