Heavy current test pawl

Abstract

The invention provides a heavy current test pawl used for a semiconductor device. Based on a traditional test pawl, a pawl end is made of tungsten-copper alloy instead, and the tungsten-copper alloy pawl end is connected to a test pawl reed with a method of laser welding. In the tungsten-copper alloy, mass percent of copper is 45-65%, and width of contact surface between the pawl end and the device is larger than the traditional, and is 1.2 mm to 1.7 mm; an included angle of the pawl end contact surface and a pawl end outer side surface is 45 degrees to 75 degrees, and an included angle of the pawl end contact surface and a pawl end inner side surface is 120 degrees to 150 degrees; a test pawl seat is made of ceramic material. The test pawl is provided for a heavy current semiconductor case chip separator to carry out testing, and a product in a circuit whose test current is larger than 10 A and less than 75 A can be tested. The test pawl has low contact resistance and low heat productivity, electro erosion speed of the pawl end of the test pawl can be reduced substantially, and a service life of the test pawl is raised by five times or more compared with the traditional test pawl.

Description

technical field [0001] The invention relates to a test claw for semiconductor testing, in particular to a test claw suitable for use in large current test circuits. Background technique [0002] Test claws (also known as gold fingers) are components used in automatic testing and sorting equipment for semiconductor devices, including test claw seats, reeds, and claw ends. The task of the test claw is to make test contact with the lead legs of the semiconductor device to complete the signal connection between the semiconductor device under test and the tester. Commonly used test claws are made of copper / steel / copper composite materials with a thickness of 0.4mm in order to deal with the contradiction between elasticity / conductivity and service life. The problems of electric corrosion and heat generation at the claw end are not serious when testing with a small current (10A) or less. . However, after the test is greater than 20A (such as high-current diodes, high-power MOSFET...

AI Technical Summary

Problems solved by technology

The test claw has multiple adjustment blocks. Although it can reduce the replacement cost of other components, it is troublesome to replace and debug, and it cannot change the fundamental problem of severe heat generation at the claw end, which leads to electrical corrosion.

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