Crystal silicon ingot furnace thermal field thermal gate control device and control method thereof

A control device and an ingot furnace technology, which are applied in the field of ingot casting in a crystalline silicon ingot furnace, can solve the problems of uneven symmetry of heat dissipation channels, influence on nucleation quality, crystal nucleation and growth influence, etc., so as to make full use of heat dissipation area , to meet the process requirements, the effect of good control ability

Inactive Publication Date: 2012-03-28
杭州志在材料科技有限公司
View PDF4 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Excessive radiation at the initial stage will greatly affect the quality of nucleation and increase additional energy consumption, such as method 3; insufficient radiation in the later stage will lead to poor continuity and slow growth of crystal growth, such as methods 1 and 2; poor heat dissipation channels Uniform symmetry will also adversely affect crystal nucleation and growth, such as method 4

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Crystal silicon ingot furnace thermal field thermal gate control device and control method thereof
  • Crystal silicon ingot furnace thermal field thermal gate control device and control method thereof
  • Crystal silicon ingot furnace thermal field thermal gate control device and control method thereof

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach

[0043] like Figure 5-11 In the hot field control device shown in the figure, a crucible 2 and a heat exchange table 3 for containing crystalline silicon raw materials are arranged in the heat insulation cage 1, and a cold plate 4 through which cooling water is passed through the inside of the heat insulation cage 1 is arranged below the heat insulation cage 1. A heat shield assembly is arranged between the bottoms of the cage, and the opening formed in the center of the heat shield assembly can be gradually opened to the surroundings or closed to the center in a centrally symmetrical manner.

[0044]The heat shield assembly is composed of four fan-shaped circular heat shields 5 evenly distributed in the circumferential direction. There is an arc-shaped receiving opening on the bottom of one side of the heat shield, and an arc-shaped lap joint on the other side surface. platform; the arc-shaped receiving opening of a heat shield is used to accommodate the arc-shaped overlappin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a crystal silicon ingot furnace thermal field thermal gate control device and a control method thereof. In the existing thermal field thermal gate control methods, the preliminary radiant quantity maybe excessive to greatly influence the nucleation quality and increase extra energy consumption; the later-period radiant quantity maybe insufficient to cause bad crystal growth continuity and slow growth speed; and the cooling channels may be unevenly symmetric to cause disadvantaged influences to the crystal nucleation and growth. The crystal silicon ingot furnace thermal field thermal gate control device comprises a heat insulation cage, a heater and a heat exchange table, wherein the heater and the heat exchange table are arranged in the heat insulation cage; a cold plate in which cooling water passes through is arranged below the heat insulation cage; and a heat insulation plate assembly, the central opening of which can be opened toward the periphery or closed toward the center in a central symmetric manner, is formed between the cold plate and the bottom of the heat insulation cage. In the invention, a central symmetric opening and closing method is adopted, so that the crystal growth with low energy consumption can be kept, the cooling area can be fully utilized and the preliminary nucleation and stable oriented growth of crystals can be effectively controlled.

Description

[0001] technical field [0002] The invention belongs to the technical field of ingot casting in crystalline silicon ingot furnaces, and relates to a control device for hot spots in the thermal field of crystalline silicon ingot furnaces that adopts center-symmetrical opening and closing. Background technique [0003] Crystalline silicon ingot furnace is a kind of silicon remelting ingot casting equipment, which is an important process equipment for preparing silicon wafers for solar cells. [0004] The quality of the crystal growth system of the crystal silicon ingot furnace is mainly determined by the thermal field in the furnace, and the quality of the thermal field is mainly reflected in the hot structure and control of the thermal field. [0005] An ideal ingot furnace crystal growth system can first produce a critical supercooling degree at the center of the bottom of the crucible so that the melt is preferentially nucleated here, and the formed nuclei are under the jo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C30B11/00C30B28/06C30B29/06
Inventor 刘芝徐芳华赵波卢雪梅
Owner 杭州志在材料科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products