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Method for analyzing failure of crystal oscillator

A technology of failure analysis and crystal oscillator, which is applied in the direction of material analysis, optical testing flaws/defects, measuring devices, etc. using the measurement of secondary emissions.

Inactive Publication Date: 2012-04-25
SHANGHAI FALAB TEST
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In order to solve the problem that the prior art method cannot carry out complete technical analysis to the failed crystal oscillator, the present invention provides the following technical solutions:

Method used

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  • Method for analyzing failure of crystal oscillator
  • Method for analyzing failure of crystal oscillator
  • Method for analyzing failure of crystal oscillator

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Embodiment Construction

[0015] The process embodiment will be described in detail below, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0016] like figure 1 As shown in the flow chart of the analysis method of the present invention, a certain invalid chip crystal oscillator sample is analyzed according to this analysis flow:

[0017] A. Analyze the appearance of defective crystal oscillator samples, and find that the samples have abnormal wear and cracking;

[0018] B. Carry out electrical tests on the defective crystal oscillator samples, use the S&A250B crystal oscillator tester to test the electrical parameters of the good crystal oscillator samples and the defective crystal oscillator samples at room temperature, -20°C, and 70°C, and the obtained frequency values ​​are shown in Table 1. The test results show that the frequency (FL), equivalent ser...

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Abstract

The invention provides a method for analyzing the failure of a crystal oscillator. The method comprises the following steps of: A, analyzing the appearance of a crystal oscillator sample required to be analyzed, and searching a possible failure cause; B, electrically testing the crystal oscillator sample required to be analyzed to obtain frequency, equivalent series resistance and maximum impedance; C, unsealing the crystal oscillator sample required to be analyzed, and electrically testing the crystal oscillator sample required to be analyzed; D, performing inner observation on the unsealed crystal oscillator sample by using an optical microscope; E, performing inner observation on the unsealed crystal oscillator sample by using a scanning electron microscope; and F, comprehensively analyzing results which are obtained in the steps, and summarizing the failure cause of the crystal oscillator sample. The method has the advantages that: by using limited analysis instruments, the failure cause of elements of the crystal oscillator is quickly found in a short time; detailed and complete analysis is realized; and effective information is provided for improvement of a production process of the crystal oscillator.

Description

technical field [0001] The invention relates to a method for crystal oscillator failure analysis. Background technique [0002] Quartz crystal oscillator is one of the important components in electronic circuits, mainly composed of quartz wafer, silver film layer electrodes, leads, brackets and shells. Usually, it is used as a frequency-stabilizing component in an oscillating circuit; it is used as a frequency-selective component in a filter circuit. In general, near the resonant frequency, the quartz crystal oscillator can be equivalent to an equivalent circuit composed of R, C, and L, and these equivalent parameters are related to many factors. In electronic circuits, the main failure modes of quartz resonators are open circuit, short circuit, and poor frequency stability. The causes of open circuit and short circuit are mainly due to the falling off of the bracket, de-tinning, mechanical damage of the shell packaging system, etc., and there are many factors that cause p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01N21/88G01N23/22
Inventor 李红高
Owner SHANGHAI FALAB TEST
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