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Method for automatically generating test pattern vector of DSP (Digital Signal Processor) device

A test pattern, automatic generation technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of difficult signal acquisition, difficult to determine, complex instructions, etc., and achieve the effect of easy signal acquisition

Active Publication Date: 2013-07-10
湖北航天技术研究院计量测试技术研究所
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the hundreds of pins of DSP devices, high system integration and complex instructions, its internal Harvard structure, pipeline operation and parallel operation of instructions make the operation result of each clock cycle very complicated and difficult to determine. In addition, Due to the complexity of communication between internal modules, the results of many command operations are not directly transmitted to the output pins of the device, and signal acquisition is very difficult

Method used

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  • Method for automatically generating test pattern vector of DSP (Digital Signal Processor) device
  • Method for automatically generating test pattern vector of DSP (Digital Signal Processor) device
  • Method for automatically generating test pattern vector of DSP (Digital Signal Processor) device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] a. Write the source program:

[0031] Use the assembly language in the DSP instruction set to write the source program;

[0032] b. Software simulation:

[0033] Use CCS3.3 software to simulate the functions of each part of the DSP device, convert the final source program into an executable .out file, and convert the .out file into a .hex file;

[0034] c. Build a development system:

[0035] Burn the .hex file to the external memory, build a development system consisting of SP3160V large-scale integrated circuit test system, development board and adapter, and provide DSP devices with power supply, clock, reset signal and off-chip auxiliary devices and information for normal operation ;

[0036] d. Hardware emulation:

[0037] The development system provides the signal of the normal operation of the DSP device, uses the hardware emulation box to burn the final source program to the DSP device through the JTAG port on the DSP device, and checks the running process an...

Embodiment 2

[0045] a. Write the source program:

[0046] Use the C language in the DSP instruction set to write the source program;

[0047] b. Software simulation:

[0048] Use CCS3.3 software to simulate the functions of each part of the DSP device, convert the final source program into an executable .out file, and convert the .out file into a .hex file;

[0049] c. Build a development system:

[0050] Burn the .hex file to EEPROM, build a development system consisting of SP3160V large-scale integrated circuit test system, development board and adapter, and provide DSP devices with power, clock, reset signals, and off-chip auxiliary devices and information for normal operation;

[0051] d. Hardware emulation:

[0052] The development system provides the signal of the normal operation of the DSP device, uses the hardware emulation box to burn the final source program to the DSP device through the JTAG port on the DSP device, and checks the running process and results of the program th...

Embodiment 3

[0060] a. Write the source program:

[0061] Use the C language in the DSP instruction set to write the source program;

[0062] b. Software simulation:

[0063] Use CCS3.3 software to simulate the functions of each part of the DSP device, convert the final source program into an executable .out file, and convert the .out file into a .hex file;

[0064] c. Build a development system:

[0065]Burn the .hex file to EEPROM, build a development system consisting of SP3160V large-scale integrated circuit test system, development board and adapter, and provide DSP devices with power, clock, reset signals, and off-chip auxiliary devices and information for normal operation;

[0066] d. Hardware emulation:

[0067] The development system provides the signal of the normal operation of the DSP device, uses the XDS560 hardware simulation box to burn the final source program to the DSP device through the JTAG port on the DSP device, and checks the process and results of the program run...

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Abstract

The invention relates to a method for automatically generating a test pattern vector of a DSP (Digital Signal Processor) device. The method comprises the following steps of: coding a source program; simulating by software; establishing a development system; simulating by hardware; guiding, loading and running a final source program; acquiring and recording output information of an outside memory and output information of the DSP device, and forming an initial test pattern vector by taking a first part as a process of Bootloader after the DSP is electrified and reset and a second part as a process of codes running in the DSP; and processing and converting the initial test pattern vector, getting rid of a development tool, and directly supplying output signals of the first part of a test pattern vector to the DSP to be as input information through a simulation chip outer memory of a test system, combining the input information and the output information of the DSP when the second part of the pattern vector is changeless, and generating the test pattern vector. Through the method disclosed by the invention, the automatic generation of the test pattern vector of the DSP can be realized without needing of professional technicians to analyze each instruction period signal, and the signal acquisition is not only easy, but also convenient and reliable.

Description

technical field [0001] The invention relates to a method for generating graphic vectors, in particular to a method for automatically generating graphic vectors for DSP device testing. Background technique [0002] Compared with the previous large-scale integrated circuits, DSP has obvious advantages in terms of weight, volume, performance and price, and is widely used. DSP testing is an important part of the DSP design process. On the one hand, as the complexity of the system increases, the ratio of the number of transistors in the DSP to the number of device pins will increase exponentially. If each circuit is to be tested, the test program will become more and more complicated, and the test vector will become more and more complicated. On the other hand, in order to protect the interests of IP owners, IP users often have no way of knowing its internal logic structure, so the focus of DSP testing has shifted from circuit structure and fault-oriented to function-oriented. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3183
Inventor 宋芳怯新现常辉李永梅罗向阳邓念平张文安
Owner 湖北航天技术研究院计量测试技术研究所
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