Current sampling circuit of metal oxide semiconductor field effect transistor (MOSFET) switch element
A switching element and current sampling technology, which is applied in the direction of measuring current/voltage, measuring electrical variables, measuring devices, etc., can solve the problems that cannot use MOSFET switching element current sampling circuit, etc., to improve the working voltage range, increase the voltage difference, The effect of removing power loss
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[0062] The content of the present invention will be further described below in conjunction with the accompanying drawings.
[0063] In order to solve the problem that the power loss of the current detection circuit of the traditional MOSFET switching element increases and the problem that the current detection circuit of the traditional MOSFET switching element cannot be applied to the integrated circuit of the drive control chip and the MOSFET switching element; the invention provides an improved MOSFET switching element The current sampling circuit directly samples the voltage difference between the first terminal and the second terminal of the MOSFET switching element, and the maximum allowable voltage difference between the first input terminal and the second input terminal of the sampling module is between the two input terminals of the sampling module The withstand voltage value between. When working at high voltage, due to the MOSFET switching element working in switch ...
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