Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Millimeter-wave imaging system for omni-directional scanning of single antenna array

A technology of millimeter-wave imaging and antenna array, which is applied in radio wave measurement system, radio wave reflection/re-radiation, and re-radiation, can solve the problems of long imaging time, low resolution, and poor image quality, and achieve structural The result of simple design, high image quality and short imaging time

Active Publication Date: 2012-07-11
BEIJING HUAHANG HAIYING NEW TECH DEV
View PDF4 Cites 30 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Using the existing millimeter-wave close-range imaging method, the image quality is poor, the resolution is low, and the imaging time is long. The millimeter-wave imaging system using the existing millimeter-wave close-range imaging method is complex in design and high in cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Millimeter-wave imaging system for omni-directional scanning of single antenna array
  • Millimeter-wave imaging system for omni-directional scanning of single antenna array
  • Millimeter-wave imaging system for omni-directional scanning of single antenna array

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0032] figure 1 It is a three-dimensional structural schematic diagram of a millimeter-wave imaging system for omni-directional scanning with a single antenna array of the present invention. The millimeter-wave imaging system for omni-directional scanning of a single antenna array of the present invention includes: 1 transmitting antenna array, 1 receiving antenna array, antenna array disk bracket, slide rail, driving disk, 2 metal poles, transmitting module, Receiving module, servo control module, frequency synthesis module, delay module, signal processing module and display control module; where:

[0033] The antenna array disk support includes a rotatable central shaft and a metal circular disk driven by the central shaft to rotate. The radius of the circular disk is between 0.5-2 meters.

[0034] The transmitting antenna array and the r...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Radianaaaaaaaaaa
Center frequencyaaaaaaaaaa
Login to View More

Abstract

The invention relates to a millimeter-wave imaging system for the omni-directional scanning of a single antenna array. The millimeter-wave imaging system comprises an antenna array disc bracket, a sliding rail, a drive disc, two metal struts, a servo control module, a frequency synthesis module, a transmitting module, a transmitting antenna array, a receiving antenna array, a receiving module, a delay module, a signal processing module and a display control modules, wherein the servo control module controls a drive shaft of a motor to rotate at a sinusoidal velocity, and controls and detects the rotation angle of the antenna array disc bracket, so that the antenna array disc bracket rotates at an angle of 0-300 degrees; the transmitting antenna arrays radiate radio-frequency signals to the surface of a target, and after being reflected by the surface of the target, the radio-frequency signals are received by the receiving antenna arrays; echo signals are processed by the receiving module so as to form intermediate-frequency echo signals, and then the intermediate-frequency echo signals are sent to the signal processing module; and the intermediate-frequency echo signals are performed three-dimensional imaging processing in the signal processing module so as to obtain three-dimensional image data, and then the three-dimensional image data is transmitted to the display control module. The system provided by the invention has the advantages of simple design, low cost, high image quality, high resolution and short imaging time.

Description

technical field [0001] The invention relates to the technical field of millimeter-wave imaging, in particular to a millimeter-wave imaging system capable of omnidirectional scanning with a single antenna array. Background technique [0002] Today, with the development of mmWave technology and imaging technology, there are many applications combining these two technologies. Millimeter-wave imaging technology has mature applications in many fields, such as map remote sensing, military detection, millimeter-wave synthetic aperture radar imaging, and long-distance detection of ground, sea and air targets. With the development of science and technology, millimeter-wave devices are basically mature at home and abroad, and can be used in large-scale and low-cost applications. [0003] With the development of millimeter wave imaging technology, its application in various industries has gradually matured, and its application in short-range imaging detection is basically mature, whic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01S13/89
Inventor 张远航陈晔张炳煌
Owner BEIJING HUAHANG HAIYING NEW TECH DEV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com