High-precision time interval measurement device

Abstract

The invention discloses a high-precision time interval measurement device, which is used for reshaping signals generated by blocking devices by means of a signal conditioning module based on a phase-modulated high-precision time interval measurement method into square wave signals recognizable by an FPGA (field programmable gate array). In the FPGA, the square wave signals standing for start and stop are integrated into a pulse signal with a certain pulse width by a trigger. A phase-locked loop is constructed in the FPGA, multichannel clock signals with fixed phase differences are obtained after frequency multiplication, debounce and phase shift of an external clock, and the clock signals are used for driving an FPGA interior counter to perform pulse counting so as to obtain a group of count values. The count values are transmitted to a single chip microcomputer for computation by the FPGA, and computed results are transmitted to a display module to complete display of the time interval measurement values. The high-precision time interval measurement device realizes precise measurement and real-time display of time interval, principle errors are eliminated, monolithic integration and flexible extension in the FPGA are easy, and the device is used for speed measurement of high-speed movement.

Description

technical field [0001] The invention belongs to the technical field of time interval measurement, and mainly relates to the precise measurement of the intercept time of high-speed moving objects, in particular to a high-precision time interval measurement device. It is used for speed testing in high-speed motion, or provides a high-precision time interval measurement device for speed testing in high-speed motion. Background technique [0002] In the speed test of high-speed moving particles, the time interval is a parameter that needs to be tested frequently. There are many types of timing instruments used to measure time intervals, but in the measurement of high-speed moving particles, due to the high speed, small speed measurement distance, and complex test environment, it is easy to be interfered by electromagnetic and power fluctuations. Compared with the time measuring instrument used for high-speed moving particle test, the requirements for response, precision, resolu...

AI Technical Summary

Problems solved by technology

The delay line method has a simple structure and is easy to integrate on a single chip. It can realize the measurement of small time intervals. The disadvantage is that with the improvement of measurement resolution, the length of the delay line is required to be shorter and shorter. When the measured time interval value is large, the delay The number of lines will be greatly increased

The basic principle of phase shifting technology is to use n clock signals with the same frequency but with fixed phase difference as the counting clock to drive the counter, and take the average value of the counting as the final measurement result, which can improve the measurement resolution to 1 / n of the reference clock, but This method does not make full use of the phase information of the obtained clock. When the clock frequency is high, the resolution of the phase shift will be reduced, and it is difficult to measure with high precision.

[0008] Through the literature search within a certain range by the applicant of the present invention, no closer relevant information was found

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