High-precision time interval measurement device

A time interval measurement, high-precision technology, applied in the direction of electrical unknown time interval measurement, time interval measurement devices, instruments, etc., can solve the problems of not making full use of clock phase information, not finding relevant information, and difficulty in high-precision measurement , to achieve the effect of facilitating function expansion, reducing risks, and stabilizing the system

Inactive Publication Date: 2012-08-01
XIAN MODERN CHEM RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The delay line method has a simple structure and is easy to integrate on a single chip. It can realize the measurement of small time intervals. The disadvantage is that with the improvement of measurement resolution, the length of the delay line is required to be shorter and shorter. When the measured time interval value is large, the delay The number of lines will be greatly increased
The basic principle of phase shifting technology is to use n clock signals with the same frequency but with fixed phase difference as the counting clock

Method used

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  • High-precision time interval measurement device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] see figure 1, The measuring device includes: counting module, display circuit module, signal conditioning module, FPGA module, single-chip microcomputer module and high-precision crystal oscillator, the signal generated by the section device is connected to the signal conditioning module, and the output of the signal conditioning module is connected to the FPGA module, high-precision The clock signal of the crystal oscillator is connected to the dedicated clock input terminal of the FPGA module, and the output terminal of the FPGA module 2 is connected to the single-chip microcomputer module; the external high-precision crystal oscillator is frequency-multiplied and de-jittered under the action of the internal phase-locked loop of the FPGA module 2 to obtain a high-frequency clock , through phase-shift control inside the FPGA module 2, multiple clocks with N channels of the same frequency and fixed phase difference are generated. The asynchronous universal transceiver (...

Embodiment 2

[0037] The high-precision time interval measurement device is the same as that in Embodiment 1. The present invention is a high-precision time interval measurement device optimized and constructed on the basis of a high-precision time interval measurement method based on phase modulation. More devices can also be constructed. The degree of digitalization and integration continues to increase. The measuring device adopts digital processing chips such as other single-chip microcomputers, and the processing data is fast and efficient, and the present invention does not require manual participation in calculation. At the same time, the system is flexible in expansion and easy to integrate.

[0038] The high-precision time interval measurement method based on phase modulation is to convert an external high-precision clock into N multiple clock signals with the same frequency and fixed phase difference through clock digital phase shift control, and use this as the reference clock of...

Embodiment 3

[0058] The high-precision time interval measuring device is the same as Embodiment 1-2, and will be further described in detail below in conjunction with the accompanying drawings and in conjunction with the work of the present invention.

[0059] see figure 1The signal conditioning module of the present invention obtains the time interval signal T by filtering, amplifying, and shaping the signal generated by the sectioning device, that is to say, the processed time interval signal T is a standard signal that can be recognized by the FPGA module 2 . The external high-precision crystal oscillator 1 is frequency-multiplied and de-jittered under the action of the internal phase-locked loop of the FPGA module 2 to obtain a high-frequency clock, and then through phase-shift control to generate multiple clocks with the same frequency and fixed phase difference, which are driven separately The counters count pulses in their respective clock cycles. The count value obtained is transm...

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Abstract

The invention discloses a high-precision time interval measurement device, which is used for reshaping signals generated by blocking devices by means of a signal conditioning module based on a phase-modulated high-precision time interval measurement method into square wave signals recognizable by an FPGA (field programmable gate array). In the FPGA, the square wave signals standing for start and stop are integrated into a pulse signal with a certain pulse width by a trigger. A phase-locked loop is constructed in the FPGA, multichannel clock signals with fixed phase differences are obtained after frequency multiplication, debounce and phase shift of an external clock, and the clock signals are used for driving an FPGA interior counter to perform pulse counting so as to obtain a group of count values. The count values are transmitted to a single chip microcomputer for computation by the FPGA, and computed results are transmitted to a display module to complete display of the time interval measurement values. The high-precision time interval measurement device realizes precise measurement and real-time display of time interval, principle errors are eliminated, monolithic integration and flexible extension in the FPGA are easy, and the device is used for speed measurement of high-speed movement.

Description

technical field [0001] The invention belongs to the technical field of time interval measurement, and mainly relates to the precise measurement of the intercept time of high-speed moving objects, in particular to a high-precision time interval measurement device. It is used for speed testing in high-speed motion, or provides a high-precision time interval measurement device for speed testing in high-speed motion. Background technique [0002] In the speed test of high-speed moving particles, the time interval is a parameter that needs to be tested frequently. There are many types of timing instruments used to measure time intervals, but in the measurement of high-speed moving particles, due to the high speed, small speed measurement distance, and complex test environment, it is easy to be interfered by electromagnetic and power fluctuations. Compared with the time measuring instrument used for high-speed moving particle test, the requirements for response, precision, resolu...

Claims

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Application Information

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IPC IPC(8): G04F10/00G04F10/04
Inventor 易春林冯伟狄长安孔德仁张朗周涛吕永柱谷鸿平李广嘉栗保华
Owner XIAN MODERN CHEM RES INST
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