Float process shift window interface analyzer based on continuous capacitance measurement

An analyzer and capacitance technology, applied in the direction of liquid level indicators for physical variable measurement, can solve the problems of high quality requirements for debugging personnel, limited instrument use range, and easy to produce errors, etc., to achieve novel and simple electrical structure, high Accurate, reliable circuit operation results

Inactive Publication Date: 2012-08-15
TIANJIN HENGLIYUANDA INSTR
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] To perform high-precision capacitance measurement, the measurement environment is required to be very stable, which limits the scope of use of the instrument
At the same time, the traditional interface analyzer

Method used

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  • Float process shift window interface analyzer based on continuous capacitance measurement
  • Float process shift window interface analyzer based on continuous capacitance measurement
  • Float process shift window interface analyzer based on continuous capacitance measurement

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Embodiment Construction

[0047] The floating window interface analyzer based on continuous measurement of capacitance of the present invention will be described in detail below with reference to the embodiments and the accompanying drawings.

[0048] Such as figure 1 , figure 2 As shown, the float window interface analyzer based on continuous measurement of capacitance of the present invention includes: a window-moving sensor 3 connected in series, a cantilever bridge circuit 4, an amplification detection integration circuit 5, a central processing circuit 6 and The human-machine interface circuit 7, the central processing circuit 6 is also connected to the window-moving sensor 3, and is also provided with an isolated power supply circuit and a reference signal generation circuit. The isolated power supply circuit and the reference signal generation circuit are composed of an isolation power supply and a reference signal generation circuit. The reference signal generation circuit 8 is integrally for...

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Abstract

The invention relates to a float process shift window interface analyzer based on continuous capacitance measurement, comprising shift window-type sensors which are sequentially connected serially, are used for converting the physical information of an interface to be measured into electronic information and comprise a plurality of sections of rapiers, a cantilever-type bridge circuit, an amplification detection integral circuit which amplifies and rectifies an input signal to be measured into an integral signal which is in linear corresponding relationship, a central processing circuit whichis used for controlling the on and the off of a shift window-type sensor window body and a man-machine interface circuit which is used for outputting a final processing result; and according to the float process shift window interface analyzer based on continuous capacitance measurement, an electric structure is novel and simple, a substance interface analysis circuit which has high reliability and high precision and does not need manual debugging is arranged, the circuit works reliably and has high efficiency, and the result analysis precision is high. The float process shift window interface analyzer based on continuous capacitance measurement can be widely applied in the measurement of a gas-liquid interface, a gas-solid interface and a liquid-liquid interface.

Description

technical field [0001] The invention relates to a capacitance measurement technology for material interface analysis. In particular, it relates to a floating window interface analyzer for material interface analysis based on continuous measurement of capacitance. Background technique [0002] For material interface analysis, the following measurement techniques are usually mainly used: [0003] 1. Capacitive measurement technology; 2. Guided wave radar measurement technology; 3. Mechanical measurement technology. [0004] At present, the capacitive measurement technology that can be used for material interface analysis mainly uses the following circuits: [0005] 1. Charge and discharge capacitance measurement circuit; 2. AC bridge capacitance measurement circuit; 3. Capacitance measurement circuit based on V / T conversion; 4. Oscillation method capacitance measurement circuit. [0006] To perform high-precision capacitance measurement, the measurement environment is requi...

Claims

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Application Information

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IPC IPC(8): G01F23/26
Inventor 鲍云竹耿八一李富强
Owner TIANJIN HENGLIYUANDA INSTR
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