Float process shift window interface analyzer based on continuous capacitance measurement

Abstract

The invention relates to a float process shift window interface analyzer based on continuous capacitance measurement, comprising shift window-type sensors which are sequentially connected serially, are used for converting the physical information of an interface to be measured into electronic information and comprise a plurality of sections of rapiers, a cantilever-type bridge circuit, an amplification detection integral circuit which amplifies and rectifies an input signal to be measured into an integral signal which is in linear corresponding relationship, a central processing circuit whichis used for controlling the on and the off of a shift window-type sensor window body and a man-machine interface circuit which is used for outputting a final processing result; and according to the float process shift window interface analyzer based on continuous capacitance measurement, an electric structure is novel and simple, a substance interface analysis circuit which has high reliability and high precision and does not need manual debugging is arranged, the circuit works reliably and has high efficiency, and the result analysis precision is high. The float process shift window interface analyzer based on continuous capacitance measurement can be widely applied in the measurement of a gas-liquid interface, a gas-solid interface and a liquid-liquid interface.

Description

technical field [0001] The invention relates to a capacitance measurement technology for material interface analysis. In particular, it relates to a floating window interface analyzer for material interface analysis based on continuous measurement of capacitance. Background technique [0002] For material interface analysis, the following measurement techniques are usually mainly used: [0003] 1. Capacitive measurement technology; 2. Guided wave radar measurement technology; 3. Mechanical measurement technology. [0004] At present, the capacitive measurement technology that can be used for material interface analysis mainly uses the following circuits: [0005] 1. Charge and discharge capacitance measurement circuit; 2. AC bridge capacitance measurement circuit; 3. Capacitance measurement circuit based on V / T conversion; 4. Oscillation method capacitance measurement circuit. [0006] To perform high-precision capacitance measurement, the measurement environment is requi...

AI Technical Summary

Problems solved by technology

[0006] To perform high-precision capacitance measurement, the measurement environment is required to be very stable, which limits the scope of use of the instrument

At the same time, the traditional interface analyzer based on capacitance measurement needs to be manually calibrated before use, and the measurement results need to be manually corrected during use, which requires high quality debugging personnel and is prone to errors

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