Relaxation oscillator with low temperature drift characteristic, and debug method thereof

Abstract

The invention provides a relaxation oscillator with a low temperature drift characteristic and a debug method thereof, and relates to an oscillator field. The oscillator circuit comprises a bias module, a register and an oscillation module. The oscillation module is composed of a switching structural circuit, a comparator and a capacitor charging and discharging circuit. The oscillator uses switching structural circuit as a core, and a debug method of a current adjusting mode is combined, such that monolithic integration of the relaxation oscillator is realized while the oscillation frequency of the oscillator obtains excellent temperature stability. The disclosed switching structural circuit in the invention is provided for enable the relaxation oscillator to acquire the good temperature stability. According to a working principle of the circuit, the relaxation oscillator always possesses the good temperature stability no matter threshold voltages with different temperature characteristics are provided to the comparator by components in the switching structural circuit. The relaxation oscillator with the low temperature characteristic in the invention and the debug method thereof are suitable for any standard CMOS technologies.

Description

Technical field: [0001] The invention relates to a relaxation oscillator, in particular to a relaxation oscillator with excellent temperature stability and a debugging method thereof. Background technique: [0002] In today's society, the use of oscillators (OSC) can be seen everywhere, such as mobile phones, watches and so on. However, some applications require high-precision clock sources, such as analog-to-digital converters (ADC), digital-to-analog converters (DAC), and phase-locked loop circuits (PLL). Because the performance of the clock source directly affects the performance of the above-mentioned system, the oscillator with excellent performance has become the object of everyone's pursuit. [0003] At present, with the continuous development of the integrated circuit (IC) industry towards the system-on-chip (SOC), more and more functional circuits are developed into the way of on-chip integration. Due to the problems of higher cost and larger occupied area, discre...

AI Technical Summary

Problems solved by technology

The above-mentioned first type of method does not require complex design of the bias circuit, and can use the voltage of any temperature characteristic as the threshold value and the current of any temperature characteristic to charge and discharge the capacitor, but it requires other off-chip functional circuit modules, which is inconvenient to separate use; the above-mentioned second type of method does not require additional functional circuit modules, but it requires separate devices, which is inconvenient to use and cannot fully reflect the advantages of monolithic integration; the above-mentioned third type of method realizes the complete integration of the circuit, but requires design Reference source, increasing design difficulty

In short, the above methods all increase the cost of OSC in different ways

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