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Device and method for measuring plasma generated by delayed double-pulse laser

A plasma and measuring device technology, which is applied in the field of plasma and achieves the effects of simple structure, low manufacturing cost, and practical convenience.

Inactive Publication Date: 2012-09-19
安徽三联事故预防研究所 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, there is no report on the research on plasma electron density generated by delayed double-pulse laser

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  • Device and method for measuring plasma generated by delayed double-pulse laser
  • Device and method for measuring plasma generated by delayed double-pulse laser
  • Device and method for measuring plasma generated by delayed double-pulse laser

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Embodiment Construction

[0026] The present invention will be further described below in conjunction with accompanying drawing.

[0027] Such as figure 1 As shown, the measurement device for delayed double-pulse laser plasma produced by the present invention includes a laser 1, a laser beam divided into a fundamental frequency optical path 28 and a frequency doubled optical path 27 by a frequency doubling crystal 2 and a dichroic beam splitter 3 A dichroic light separation system, a plasma interference detection system and a plasma interference fringe receiving system, wherein the plasma interference detection system includes an interferometer 20 and a frequency-doubled light detection system, and the fundamental frequency optical path 28 is provided with a A spectroscopic system in which the light is divided into two beams, wherein the first beam 25 is used to focus the target 11 in the interferometer 20 to generate plasma, and the second beam 26 is used to focus into the plasma generated by the firs...

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Abstract

The invention discloses a device and a method for measuring plasma generated by delayed double-pulse laser. The device comprises a laser device, a dichroic light separating system, a plasma interference detecting system and a plasma interference fringe receiving system, wherein the dichroic light separating system divides a laser beam into a fundamental-frequency laser path and a frequency-doubled laser path through a frequency doubling crystal and a dichroic spectroscope, the fundamental-frequency laser path is provided with a laser dividing system which is used for dividing fundamental-frequency laser into two beams, a first beam is used for being focused in a target in an interferometer to generate plasma, and a second beam is used for being focused in the plasma generated by the first beam. The plasma generated by the delayed double-pulse laser on the surface of the target and a transparent medium can be detected. The device for measuring the plasma generated by the delayed double-pulse laser is simple in structure, low in manufacturing cost, is practical and convenient, and fills gaps of home and abroad technology.

Description

[0001] technical field [0002] The invention relates to laser plasma, in particular to a measuring device and a measuring method for delaying double-pulse laser to generate plasma. [0003] Background technique [0004] When the intense laser beam is focused on the surface of the target or in the transparent medium, when the laser power density in the focused area exceeds a certain threshold, a plasma with dramatic changes in time and space will be formed, accompanied by shock waves that propagate around. Due to the potential wide application of laser plasma, many scholars have carried out theoretical and experimental research on its generation and decay. In practical applications, people often want to prolong the lifetime of plasma, so the study of prolonging plasma lifetime by delayed double-pulse laser is of great significance. [0005] Electron density is an important parameter of laser plasma. In recent years, new progress has been made in the study of laser plasma. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/02
Inventor 刘可张树林
Owner 安徽三联事故预防研究所